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74LVC821AD Datenblatt(PDF) 5 Page - NXP Semiconductors

Teilenummer 74LVC821AD
Bauteilbeschribung  10-bit D-type flip-flop with 5-volt tolerant inputs/outputs; positive-edge trigger 3-State
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Hersteller  PHILIPS [NXP Semiconductors]
Direct Link  http://www.nxp.com
Logo PHILIPS - NXP Semiconductors

74LVC821AD Datenblatt(HTML) 5 Page - NXP Semiconductors

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Philips Semiconductors
Product specification
74LVC821A
10-bit D-type flip-flop with 5-volt tolerant
inputs/outputs; positive-edge trigger (3-State)
1998 Sep 25
5
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
CONDITIONS
LIMITS
UNIT
SYMBOL
PARAMETER
CONDITIONS
MIN
MAX
UNIT
VCC
DC supply voltage (for max. speed performance)
2.7
3.6
V
VCC
DC supply voltage (for low-voltage applications)
1.2
3.6
V
VI
DC Input voltage range
0
5.5
V
VO
DC output voltage range; output HIGH or LOW
state
0
VCC
V
O
DC output voltage range; output 3-State
0
5.5
Tamb
Operating ambient temperature range in free-air
–40
+85
°C
tr, tf
Input rise and fall times
VCC = 1.2 to 2.7V
VCC = 2.7 to 3.6V
0
0
20
10
ns/V
ABSOLUTE MAXIMUM RATINGS1
In accordance with the Absolute Maximum Rating System (IEC 134)
Voltages are referenced to GND (ground = 0V)
SYMBOL
PARAMETER
CONDITIONS
RATING
UNIT
VCC
DC supply voltage
–0.5 to +6.5
V
IIK
DC input diode current
VI t0
–50
mA
VI
DC input voltage
Note 2
–0.5 to +6.5
V
IOK
DC output diode current
VO uVCC or VO t 0
"50
mA
VO
DC output voltage; output HIGH or LOW state
Note 2
–0.5 to VCC +0.5
V
VO
DC output voltage; output 3-State
Note 2
–0.5 to 6.5
V
IO
DC output source or sink current
VO = 0 to VCC
"50
mA
IGND, ICC
DC VCC or GND current
"100
mA
Tstg
Storage temperature range
–65 to +150
°C
Power dissipation per package
PTOT
– plastic mini-pack (SO)
above +70
°C derate linearly with 8 mW/K
500
mW
– plastic shrink mini-pack (SSOP and TSSOP)
above +60
°C derate linearly with 5.5 mW/K
500
mW
NOTES:
1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the
device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to
absolute-maximum-rated conditions for extended periods may affect device reliability.
2. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.


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