Philips Semiconductors Linear Products

Product specification

ADC0820

8-Bit, high-speed,

µP-compatible A/D converter with

track/hold function

August 31, 1994

572

AC ELECTRICAL CHARACTERISTICS

SYMBOL

PARAMETER

TEST CONDITIONS

UNIT

SYMBOL

PARAMETER

TEST CONDITIONS

Min

Max

UNIT

Conversion time for RD mode

Mode=0, Figure 1

1.6

2.5

µs

Access time (delay from falling edge of

RD to output valid)

Mode=0, Figure 1

ns

Conversion time for WR-RD mode

Figures 3a and 3b

1.52

µs

Write time

Min

600

ns

Write time

Max

50

µs

Read time

Min

600

ns

Access time (delay from falling edge of

RD t o output valid)

190

280

ns

RD t o output valid)

210

320

ns

Access time (delay from falling edge of

RD t o output valid)

70

120

ns

90

150

ns

Internal comparison time

800

1300

ns

Three-state control (delay from rising

edge of RD to Hi-Z state)

100

200

ns

Delay from rising edge of WR to falling

edge of INT

ns

ns

Delay from rising edge of RD to rising

edge of INT

Figures 1, 3a, and 3b,

125

225

ns

Delay from rising edge of WR to rising

edge of INT

175

270

ns

Delay from CS to RDY

50

100

ns

Delay from INT to output valid

Figure 2

20

50

ns

Delay from RD to INT

Figure 3b

200

290

ns

Delay from end of conversion to next

conversion

500

ns

SR

Slew rate, tracking

0.1

V/

µs

Analog input capacitance

45

pF

Logic output capacitance

5

pF

Logic input capacitance

5

pF

NOTES:

1. Unadjusted error includes offset, full-scale, and linearity errors.

3. Typical values are at 25

°C and represent most likely parametric norm.

4. Guaranteed but not 100% production tested. These limits are not used to calculate outgoing quality levels.