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ADC0820CNEN Datenblatt(PDF) 10 Page - NXP Semiconductors |
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ADC0820CNEN Datenblatt(HTML) 10 Page - NXP Semiconductors |
10 / 14 page Philips Semiconductors Linear Products Product specification ADC0820 8-Bit, high-speed, µP-compatible A/D converter with track/hold function August 31, 1994 577 before reading the conversion result. INT will typically go Low 800ns after WR’s rising edge. However, if a shorter conversion time is desired, the processor need not wait for INT and can exercise a Read after only 600ns. If this is done, INT will immediately go Low and data will appear at the outputs. Stand-Alone (Figure 7) For stand-alone operation in WR-RD mode, CS and RD can be tied Low and a conversion can be started with WR. Data will be valid approximately 800ns following WR’s rising edge. Other Interface Considerations In order to maintain conversion accuracy, WR has a maximum width spec of 50 µs. When the MS flash ADC’s sampled data comparators are in comparison mode (WR is Low), the input capacitors (C, Figure 5) must hold their charge. Switch leakage can cause errors if the comparator is left in this phase for too long. Since the MS flash ADC enters its zeroing phase at the end of a conversion, a new conversion cannot be started until this phase is complete. The minimum spec for this time is 500ns (tP in Figures 1, 2, 3a, and 3b). ANALOG CONSIDERATIONS Reference and Input The two VREF inputs of the ADC0820 are fully differential and define the zero- to full-scale input range of the A/D converter. This allows the designer to easily vary the span of the analog input since this range will be equivalent to the voltage difference between VIN(+) and VIN(-). By reducing VREF(VREF=VREF(+) -VREF(-)) to less than 5V, the sensitivity of the converter can be increased (i.e., if VREF=2V, then 1 LSB=7.8mV). The input/reference arrangement also facilitates ratiometric operation and, in many cases, the chip power supply can be used for transducer power as well as the VREF source. RD LOW WR CS LOW INT DB0–DB7 Figure 7. WR-RD Mode (Pin 7 is High) Stand-Alone Operation This reference flexibility lets the input span not only be varied, but also offset from zero. The voltage at VREF(-) sets the input level which produces a digital output of all zeroes. Though VIN is not itself differential, the reference design affords nearly differential-input capability for most measurement applications. Figure 9 shows some of the configurations that are possible. Input Current Due to the unique conversion techniques employed by the ADC0820, the analog input behaves somewhat differently than in conventional devices. The A/D’s sampled data comparators take varying amounts of input current depending on which cycle the conversion is in. The equivalent input circuit of the ADC0820 is shown in Figure 10a. When a conversion starts (WR Low, WR-RD mode), all input switches close, connecting VIN to 31 1pF capacitors. Although the two 4-bit flash circuits are not both in their compare cycle at the same time, VIN still sees all input capacitors at once. This is because the MS flash converter is connected to the input during its compare interval and the LS flash is connected to the input during its zeroing phase. In other words, the LS ADC uses VIN as its zero-phase input. The input capacitors must charge to the input voltage through the on resistance of the analog switches (about 5k Ω to 10kΩ). In addition, about 12pF of input stray capacitance must also be charged. For large source resistances, the analog input can be modeled as an RC network as shown in Figure 10b. As RS increases, it will take longer for the input capacitance to charge. In RD mode, the input switches are closed for approximately 800ns at the start of the conversion. In WR-RD mode, the time that the switches are closed to allow this charging is the time that WR is Low. Since other factors force this time to be at least 600ns, input time constants of 100ns can be accommodated without special consideration. Typical total input capacitance values of 45pF allow RS to be 1.5kΩ without lengthening WR to give VIN more time to settle. Input Filtering It should be made clear that transients in the analog input signal, caused by charging current flowing into VIN, will not degrade the A/D’s performance in most cases. In effect, the ADC0820 does not “look” at the input when these transients occur. The comparators’ outputs are not latched while WR is Low, so at least 600ns will be provided to charge the ADC’s input capacitance. It is |
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