Datenblatt-Suchmaschine für elektronische Bauteile |
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AM26C32ID Datenblatt(PDF) 6 Page - Texas Instruments |
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AM26C32ID Datenblatt(HTML) 6 Page - Texas Instruments |
6 / 17 page AM26C32 QUADRUPLE DIFFERENTIAL LINE RECEIVER SLLS104I − DECEMBER 1990 − REVISED SEPTEMBER 2004 6 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 PARAMETER MEASUREMENT INFORMATION TEST CIRCUIT VOLTAGE WAVEFORMS 0 V Output VOH VOL 10% 90% 90% 10% tTLH tTHL tPLH tPHL 2.5 V −2.5 V 50% Input Device Under Test A B VCC CL = 50 pF (see Note A) Input NOTE A: CL includes probe and jig capacitance. Figure 1. Switching Test Circuit and Voltage Waveforms TEST CIRCUIT Device Under Test G Input G Input VCC S1 RL = 1 kΩ CL = 50 pF (see Note A) VID = ±2.5 V VOLTAGE WAVEFORMS tPZL, tPLZ Measurement: S1 to VCC tPZH, tPHZ Measurement: S1 to GND 1.3 V G G (see Note B) Output (with VID = 2.5 V) Output (with VID = −2.5 V) tPZH tPHZ tPZH tPHZ tPZL tPLZ tPZL tPLZ VOH −0.5 V VOL + 0.5 V VOH −0.5 V VOL + 0.5 V 3 V 0 V 3 V 0 V VOH VOL VOH VOL 1.3 V 50% 50% A Input B Input NOTES: A. CL includes probe and jig capacitance. B. The input pulse is supplied by a generator having the following characteristics: PRR = 1 MHz, duty cycle ≤ 50%, tr = tf = 6 ns. Figure 2. Enable/Disable Time Test Circuit and Output Voltage Waveforms |
Ähnliche Teilenummer - AM26C32ID |
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Ähnliche Beschreibung - AM26C32ID |
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