Datenblatt-Suchmaschine für elektronische Bauteile |
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ISL60002DIH325-TK Datenblatt(PDF) 6 Page - Intersil Corporation |
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ISL60002DIH325-TK Datenblatt(HTML) 6 Page - Intersil Corporation |
6 / 31 page 6 FN8082.7 August 1, 2006 ∆VOUT/∆t Long Term Stability (Note 4) TA = +25°C 10 ppm/ √1 kHrs ∆V OUT/∆TA Thermal Hysteresis (Note 2) ∆T A = +145°C 100 ppm ISC Short Circuit Current (Note 3) TA = +25°C 50 80 mA VN Output Voltage Noise 0.1Hz ≤ f ≤ 10Hz 30 µVP-P Electrical Specifications ISL60002-33, VOUT = 3.300V (Continued) Operating Conditions: VIN = 5.0V, IOUT = 0mA, COUT = 0.001µF, TA = -40 to +105°C, unless otherwise specified. SYMBOL PARAMETER CONDITIONS MIN TYP MAX UNITS Common Electrical Specifications ISL60002 -10, -11, -12, -18, -20, and -25 Operating Conditions: VIN = 3.0V, IOUT = 0mA, COUT = 0.001µF, TA = -40 to +85°C, unless otherwise specified SYMBOL PARAMETER CONDITIONS MIN TYP MAX UNITS TC VOUT Output Voltage Temperature Coefficient (Note 1) 20 ppm/°C IIN Supply Current 350 900 nA ∆VOUT/∆VIN Line Regulation +2.7V ≤ VIN ≤ +5.5V 80 250 µV/V ∆V OUT/∆IOUT Load Regulation 0mA ≤ I SOURCE ≤ 7mA 25 100 µV/mA -7mA ≤ ISINK ≤ 0mA 50 150 µV/mA ∆VOUT/∆t Long Term Stability (Note 4) TA = +25°C 10 ppm/ √1 kHrs ∆V OUT/∆TA Thermal Hysteresis (Note 2) ∆T A = +125°C 100 ppm ISC Short Circuit Current (Note 3) TA = +25°C 50 80 mA VN Output Voltage Noise 0.1Hz ≤ f ≤ 10Hz 30 µVP-P NOTES: 1. Over the specified temperature range. Temperature coefficient is measured by the box method whereby the change in VOUT is divided by the temperature range: (-40°C to +85°C = +125°C, or -40°C to +105°C = +145°C for the ISL60002-33). 2. Thermal Hysteresis is the change in VOUT measured @ TA = +25°C after temperature cycling over a specified range, ∆TA, VOUT is read initially at TA = +25°C for the device under test. The device is temperature cycled and a second VOUT measurement is taken at +25°C. The difference between the initial VOUT reading and the second VOUT reading is then expressed in ppm. For ∆TA = +125°C, the device under is cycled from +25°C to +85°C to -40°C to +25°C, and for ∆T A = +145°C, the device under is cycled from +25°C to +105°C to -40°C to +25°C 3. Guaranteed by device characterization and/or correlation to other device tests. 4. FGA™ voltage reference long term drift is a logarithmic characteristic. Changes that occur after the first few hundred hours of operation are significantly smaller with time, asymptotically approaching zero beyond 2000 hours. Because of this decreasing characteristic, long-term drift is specified in ppm/ √1kHr. 5. Pb-free manufacturing can result in solder reflow temperatures exceeding the +225°C absolute maximum. Exposing the device to this reflow temperature will not damage it or cause any functional issues and the device will operate normally. The high reflow temperature may result in a permanent shift in output voltage of 500µV to 1.0mV depending on the temperature and exposure time. If possible, using a reduced reflow temperature in production will result in the best possible output voltage accuracy. ISL60002 |
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