Datenblatt-Suchmaschine für elektronische Bauteile |
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KMPC860DEZQ50D4 Datenblatt(PDF) 11 Page - Freescale Semiconductor, Inc |
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KMPC860DEZQ50D4 Datenblatt(HTML) 11 Page - Freescale Semiconductor, Inc |
11 / 80 page MPC860 Family Hardware Specifications, Rev. 7 Freescale Semiconductor 11 Layout Practices 7.4 Estimation Using Simulation When the board temperature is not known, a thermal simulation of the application is needed. The simple two-resistor model can be used with the thermal simulation of the application [2], or a more accurate and complex model of the package can be used in the thermal simulation. 7.5 Experimental Determination To determine the junction temperature of the device in the application after prototypes are available, the thermal characterization parameter ( ΨJT) can be used to determine the junction temperature with a measurement of the temperature at the top center of the package case using the following equation: TJ = TT + (ΨJT × PD) where: Ψ JT = thermal characterization parameter TT = thermocouple temperature on top of package PD = power dissipation in package The thermal characterization parameter is measured per JEDEC JESD51-2 specification using a 40 gauge type T thermocouple epoxied to the top center of the package case. The thermocouple should be positioned so that the thermocouple junction rests on the package. A small amount of epoxy is placed over the thermocouple junction and over 1 mm of wire extending from the junction. The thermocouple wire is placed flat against the package case to avoid measurement errors caused by cooling effects of the thermocouple wire. 7.6 References Semiconductor Equipment and Materials International (415) 964-5111 805 East Middlefield Rd. Mountain View, CA 94043 MIL-SPEC and EIA/JESD (JEDEC) Specifications 800-854-7179 or (Available from Global Engineering Documents) 303-397-7956 JEDEC Specifications http://www.jedec.org 1. C.E. Triplett and B. Joiner, “An Experimental Characterization of a 272 PBGA Within an Automotive Engine Controller Module,” Proceedings of SemiTherm, San Diego, 1998, pp. 47–54. 2. B. Joiner and V. Adams, “Measurement and Simulation of Junction to Board Thermal Resistance and Its Application in Thermal Modeling,” Proceedings of SemiTherm, San Diego, 1999, pp. 212–220. 8 Layout Practices Each VDD pin on the MPC860 should be provided with a low-impedance path to the board’s supply. Each GND pin should likewise be provided with a low-impedance path to ground. The power supply pins drive distinct groups of logic on the chip. The VDD power supply should be bypassed to ground using at least four 0.1 µF-bypass capacitors located as close as possible to the four sides of the package. The capacitor leads and associated printed circuit traces connecting to chip VDD and GND should be kept to less than half an inch per capacitor lead. A four-layer board employing two inner layers as VCC and GND planes is recommended. |
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