Datenblatt-Suchmaschine für elektronische Bauteile |
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TC647BEPA713 Datenblatt(PDF) 6 Page - Microchip Technology |
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TC647BEPA713 Datenblatt(HTML) 6 Page - Microchip Technology |
6 / 34 page TC642B/TC647B DS21756B-page 6 2003 Microchip Technology Inc. FIGURE 1-4: TC642B/TC647B Electrical Characteristics Test Circuit. 1 2 3 4 6 5 7 8 VIN CF VMIN GND FAULT SENSE VOUT VDD R3 R1 C3 0.1 µF C2 1µF VDD C1 0.1 µF + - VIN + - C4 0.1 µF VMIN + - R2 K1 K2 0.1 µF 1µF .01 µF C7 C6 C5 R4 VSENSE (pulse voltage source) K4 K3 + - Current limited voltage source VDD R5 Current limited voltage source C8 0.1 µF R6 Note: C5 and C7 are adjusted to get the necessary 1 µF value. TC642B TC647B + - |
Ähnliche Teilenummer - TC647BEPA713 |
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Ähnliche Beschreibung - TC647BEPA713 |
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