Datenblatt-Suchmaschine für elektronische Bauteile |
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MCP1403 Datenblatt(PDF) 3 Page - Microchip Technology |
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MCP1403 Datenblatt(HTML) 3 Page - Microchip Technology |
3 / 22 page © 2007 Microchip Technology Inc. DS22022B-page 3 MCP1403/4/5 1.0 ELECTRICAL CHARACTERISTICS Absolute Maximum Ratings † Supply Voltage ................................................................+20V Input Voltage ...............................(VDD + 0.3V) to (GND – 5V) Input Current (VIN>VDD)................................................50 mA † Notice: Stresses above those listed under "Maximum Ratings" may cause permanent damage to the device. This is a stress rating only and functional operation of the device at those or any other conditions above those indicated in the operational sections of this specification is not intended. Exposure to maximum rating conditions for extended periods may affect device reliability. DC CHARACTERISTICS (NOTE 2) Electrical Specifications: Unless otherwise indicated, TA = +25°C, with 4.5V ≤ VDD ≤ 18V. Parameters Sym Min Typ Max Units Conditions Input Logic ‘1’, High Input Voltage VIH 2.4 1.5 — V Logic ‘0’, Low Input Voltage VIL —1.3 0.8 V Input Current IIN –1 — 1 µA 0V ≤ VIN ≤ VDD Input Voltage VIN -5 — VDD+0.3 V Output High Output Voltage VOH VDD – 0.025 — — V DC Test Low Output Voltage VOL — — 0.025 V DC Test Output Resistance, High ROH —2.2 3.0 Ω IOUT = 10 mA, VDD = 18V Output Resistance, Low ROL —2.8 3.5 Ω IOUT = 10 mA, VDD = 18V Peak Output Current IPK —4.5 — A VDD = 18V (Note 2) Latch-Up Protection With- stand Reverse Current IREV — >1.5 — A Duty cycle ≤ 2%, t ≤ 300 µsec. Switching Time (Note 1) Rise Time tR —15 28 ns Figure 4-1, Figure 4-2 CL = 2200 pF Fall Time tF —18 28 ns Figure 4-1, Figure 4-2 CL = 2200 pF Delay Time tD1 —40 48 ns Figure 4-1, Figure 4-2 Delay Time tD2 —40 48 ns Figure 4-1, Figure 4-2 Power Supply Supply Voltage VDD 4.5 — 18.0 V Power Supply Current IS —1.0 2.0 mA VIN = 3V (Both Inputs) IS — 0.15 0.25 mA VIN = 0V (Both Inputs) Note 1: Switching times ensured by design. 2: Tested during characterization, not production tested. |
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