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DAC8806IDBRG4 Datenblatt(PDF) 2 Page - Texas Instruments |
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DAC8806IDBRG4 Datenblatt(HTML) 2 Page - Texas Instruments |
2 / 20 page www.ti.com ABSOLUTE MAXIMUM RATINGS DAC8806 SBAS385A – APRIL 2006 – REVISED JUNE 2006 This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. ORDERING INFORMATION(1) MINIMUM RELATIVE DIFFERENTIAL PACKAGE- SPECIFIED TRANSPORT ACCURACY NONLINEARITY LEAD TEMPERATURE PACKAGE ORDERING MEDIA, PRODUCT (LSB) (LSB) (DESIGNATOR) RANGE MARKING NUMBER QUANTITY DAC8806IDB Tubes, 48 DAC8806I ±1 ±1 DB-28 (SSOP) –40 °C to +85°C DAC8806 DAC8806IDBR Tape and Reel, 2000 (1) For the most current package and ordering information see the Package Option Addendum at the end of this document, or see the TI web site at www.ti.com. over operating free-air temperature range (unless otherwise noted)(1) DAC8806 UNIT VDD to GND –0.3 to +7 V Digital input voltage to GND –0.3 to +VDD + 0.3 V V (IOUT) to GND –0.3 to +VDD + 0.3 V Operating temperature range –40 to +85 °C REF, ROFS, RFB, R1, RCOM to AGND, and DGND ±25 V Storage temperature range –65 to +150 °C Junction temperature range (TJ max) +125 °C Power dissipation (TJ max – TA)/RθJA W Thermal impedance, RθJA 55 °C/W ESD rating: Human body model (HBM) 4000 V Charged device model (CDM) 1000 V (1) Stresses above those listed under absolute maximum ratings may cause permanent damage to the device. Exposure to absolute maximum conditions for extended periods may affect device reliability. 2 Submit Documentation Feedback |
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