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74LVC1G53DC Datenblatt(PDF) 6 Page - NXP Semiconductors |
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74LVC1G53DC Datenblatt(HTML) 6 Page - NXP Semiconductors |
6 / 22 page 74LVC1G53_3 © NXP B.V. 2007. All rights reserved. Product data sheet Rev. 03 — 29 August 2007 6 of 22 NXP Semiconductors 74LVC1G53 2-channel analog multiplexer/demultiplexer [1] Typical values are measured at Tamb =25 °C. [2] These typical values are measured at VCC = 3.3 V 10.1 Test circuits CI input capacitance - 2.5 - - - pF CS(OFF) OFF-state capacitance - 6.0 - - - pF CS(ON) ON-state capacitance - 18 --- pF Table 7. Static characteristics …continued At recommended operating conditions; voltages are referenced to GND (ground 0 V). Symbol Parameter Conditions −40 °C to +85 °C −40 °C to +125 °C Min Typ[1] Max Min Max Unit VI =VCC or GND; VO = GND or VCC. Fig 6. Test circuit for measuring OFF-state leakage current VO IS 001aad390 S Z E Y0 Y1 VCC GND switch switch 1 1 2 2 VIL VIH S VIH VIH E VI VIL or VIH VIH VI =VCC or GND and VO = open circuit. Fig 7. Test circuit for measuring ON-state leakage current IS 001aad391 S Z E Y0 Y1 VCC GND VI VIL or VIH VIL switch 1 2VIL VIH S VIL VIL E VO switch 1 2 |
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