Datenblatt-Suchmaschine für elektronische Bauteile |
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TA1274F Datenblatt(PDF) 9 Page - Toshiba Semiconductor |
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TA1274F Datenblatt(HTML) 9 Page - Toshiba Semiconductor |
9 / 22 page TA1274F 2002-12-20 9 SIF section CHARACTERISTIC SYMBOL TEST CIR- CUIT TEST CONDITION MIN TYP. MAX UNIT SIF Maximum Input Signal vin max (s) ― 105 118 ― dBµV SIF Gain Control Range RAGC (s) ― (Note 15) 55 75 ― dB SIF Input Resistance (*) Zin R (s) ― ― 10 ― kΩ SIF Input Capacitance (*) Zin C (s) ― (Note 16) ― 2.8 ― pF Limiting Sensitivity vin lim ― (Note 17) ― 40 45 dBµV AM Reduction Ratio AMR ― (Note 18) 55 68 ― dB AF Output Signal Amplitude VDet (s) ― 350 500 710 mVrms AF Output S / N S / N (s) ― 55 63 ― dB Total Harmonics Distortion THD ― (Note 19) ― 0.2 1.0 % Hold Range of the FM Demodulator (Lower) fh (s) L ― ― ― 3.9 Hold Range of the FM Demodulator (Upper) fh (s) H ― (Note 20) 5.3 ― ― MHz Capture Range of the FM Demodulator (Upper) fp (s) H ― ― ― 4.0 Capture Range of the FM Demodulator (Lower) fp (s) L ― (Note 21) 5.2 ― ― MHz Ripple Rejection RR ― (Note 22) ― ― −22 dB *: Not tested |
Ähnliche Teilenummer - TA1274F_02 |
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Ähnliche Beschreibung - TA1274F_02 |
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