Datenblatt-Suchmaschine für elektronische Bauteile |
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TC74VHCT74AFN Datenblatt(PDF) 2 Page - Toshiba Semiconductor |
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TC74VHCT74AFN Datenblatt(HTML) 2 Page - Toshiba Semiconductor |
2 / 8 page TC74VHCT74AF/AFN/AFT 2007-10-01 2 Pin Assignment IEC Logic Symbol Truth Table Inputs Outputs CLR PR D CK Q Q Function L H X X L H Clear H L X X H L Preset L L X X H H ― H H L L H ― H H H H L ― H H X Qn n Q No Change X: Don’t care Absolute Maximum Ratings (Note 1) Characteristics Symbol Rating Unit Supply voltage range VCC −0.5 to 7.0 V DC input voltage VIN −0.5 to 7.0 V −0.5 to 7.0 (Note 2) DC output voltage VOUT −0.5 to VCC + 0.5 (Note 3) V Input diode current IIK −20 mA Output diode current IOK ±20 (Note 4) mA DC output current IOUT ±25 mA DC VCC/ground current ICC ±50 mA Power dissipation PD 180 mW Storage temperature Tstg −65 to 150 °C Note 1: Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or even destruction. Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). Note 2: VCC = 0 V Note 3: High or low state. IOUT absolute maximum rating must be observed. Note 4: VOUT < GND, VOUT > VCC Q 1 PR 1 VCC CLR 2 2D 2CK PR 2 2Q CLR 1 1D 1CK 1Q Q 2 CK Q D Q CK Q D Q 9 8 14 13 12 11 10 1 2 3 4 5 6 7 (top view) GND CLR 2 CLR 1 (12) (3) S (4) (1) (2) (11) (10) 1CK PR 1 1D 2CK 2D (5) (6) (9) (8) 1Q Q 1 2Q Q 2 C1 1D R (13) PR 2 |
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