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SN74ABTH182504A Datenblatt(PDF) 3 Page - Texas Instruments

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Teilenummer SN74ABTH182504A
Bauteilbeschribung  SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS
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Hersteller  TI [Texas Instruments]
Direct Link  http://www.ti.com
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SN74ABTH182504A Datenblatt(HTML) 3 Page - Texas Instruments

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SN54ABTH18504A, SN54ABTH182504A, SN74ABTH18504A, SN74ABTH182504A
SCAN TEST DEVICES WITH
20-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS165C – AUGUST 1993 – REVISED JULY 1996
3
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
description (continued)
Four dedicated test pins observe and control the operation of the test circuitry: test data input (TDI), test data
output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing
functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation
(PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface.
Improved scan efficiency is accomplished through the adoption of a one boundary-scan cell (BSC) per I/O pin
architecture. This architecture is implemented in such a way as to capture the most pertinent test data. A
PSA/COUNT instruction also is included to ease the testing of memories and other circuits where a binary count
addressing scheme is useful.
Active bus-hold circuitry holds unused or floating data inputs at a valid logic level.
The B-port outputs of ’ABTH182504A, which are designed to source or sink up to 12 mA, include 25-
Ω series
resistors to reduce overshoot and undershoot.
The SN54ABTH18504A and SN54ABTH182504A are characterized for operation over the full military
temperature range of –55
°C to 125°C. The SN74ABTH18504A and SN74ABTH182504A are characterized for
operation from –40
°C to 85°C.
FUNCTION TABLE†
(normal mode, each register)
INPUTS
OUTPUT
OEAB
LEAB
CLKENAB
CLKAB
A
B
L
L
L
L
X
B0‡
L
LL
LL
L
LL
HH
L
LH
X
X
B0‡
L
HX
X
L
L
L
HX
X
H
H
H
X
X
X
X
Z
† A-to-B data flow is shown. B-to-A data flow is similar but uses OEBA,
LEBA, CLKENBA, and CLKBA.
‡ Output level before the indicated steady-state input conditions were
established


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