Analog Integrated Circuit Device Data

Freescale Semiconductor

11

33879

ELECTRICAL CHARACTERISTICS

DYNAMIC ELECTRICAL CHARACTERISTICS

DIGITAL INTERFACE TIMING(14)

Recommended Frequency of SPI Operation(14)

–

4.0

–

MHz

Falling Edge of CS to Rising Edge of SCLK (Required Setup Time)

100

–

–

ns

Falling Edge of SCLK to Rising Edge of CS (Required Setup Time)

50

–

–

ns

DI to Falling Edge of SCLK (Required Setup Time)

16

–

–

ns

Falling Edge of SCLK to DI (Required Hold Time)

20

–

–

ns

DI, CS, SCLK Signal Rise Time(15)

–

5.0

–

ns

DI, CS, SCLK Signal Fall Time(15)

–

5.0

–

ns

Time from Falling Edge of CS to DO Low Impedance(16)

–

–

55

ns

Time from Rising Edge of CS to DO High Impedance(17)

–

–

55

ns

Time from Rising Edge of SCLK to DO Data Valid(18)

–

25

55

ns

Notes

14.

This parameter is guaranteed by design. Production test equipment uses 4.16MHz, 5.5V/3.1V SPI interface.

15.

Rise and Fall time of incoming DI, CS, and SCLK signals suggested for design consideration to prevent the occurrence of double pulsing.

16.

Time required for output status data to be available for use at DO pin.

17.

Time required for output status data to be terminated at DO pin.

18.

Time required to obtain valid data out from DO following the rise of SCLK.

Table 5. Dynamic Electrical Characteristics (continued)

Characteristics noted under conditions 3.1V

≤ V

Characteristic

Symbol

Min

Typ

Max

Unit