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298D106X06R3M2T Datenblatt(PDF) 4 Page - Vishay Siliconix

Teilenummer 298D106X06R3M2T
Bauteilbeschribung  Solid Tantalum Chip Capacitors MICROTAN™ Leadframeless Molded
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Hersteller  VISHAY [Vishay Siliconix]
Direct Link  http://www.vishay.com
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298D106X06R3M2T Datenblatt(HTML) 4 Page - Vishay Siliconix

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For technical questions, contact: tantalum@vishay.com
Document Number: 40065
41
Revision: 01-Sep-08
298D
Solid Tantalum Chip Capacitors
MICROTANLeadframeless Molded
Vishay Sprague
Notes
• At + 25 °C, the leakage current shall not exceed the value listed in the Standard Ratings Table
• At + 85 °C, the leakage current shall not exceed 10 times the value listed in the Standard Ratings Table
• At + 125 °C, the leakage current shall not exceed 12 times the value listed in the Standard Ratings Table
TYPICAL LEAKAGE CURRENT FACTOR RANGE
100
10
1.0
0.1
0.01
0.001
010
40
70
8090
60
50
20
30
100
+ 125 °C
+ 85 °C
+ 55 °C
+ 25 °C
0 °C
- 55 °C
PERCENT OF RATED VOLTAGE
ENVIRONMENTAL PERFORMANCE CHARACTERISTICS
ITEM
CONDITION
POST TEST PERFORMANCE
Life Test at + 85 °C
1000 h application of rated voltage at
85 °C with a 3
Ω series resistance,
MIL-STD 202G Method 108A
Capacitance Change
Refer to Standard Ratings Table
Dissipation Factor
Not to exceed 150 % of initial
Leakage Current
Not to exceed 200 % of initial
Humidity Tests
At 40 °C/90 % RH 500 h, no voltage
applied. MIL-STD 202G Method 103B
Capacitance Change
Refer to Standard Ratings Table
Dissipation Factor
Not to exceed 150 % of initial
Leakage Current
Not to exceed 200 % of initial
Thermal Shock
At - 55 °C/+ 125 °C, 30 min each,
for 5 cycles. MIL-STD 202G Method 107G
Capacitance Change
Refer to Standard Ratings Table
Dissipation Factor
Not to exceed 150 % of initial
Leakage Current
Not to exceed 200 % of initial
MECHANICAL PERFORMANCE CHARACTERISTICS
TEST CONDITION
CONDITION
POST TEST PERFORMANCE
Terminal Strength
Apply a pressure load of 5 N for 10 ± 1 s
horizontally to the center of capacitor side body.
AECQ-200 rev. C Method 006
Capacitance Change
Refer to Standard Ratings Table
Dissipation Factor
Initial specified value or less
Leakage Current
Initial specified value or less
There shall be no mechanical or visual damage to capacitors
post-conditioning.
Substrate Bending
(Board flex)
With parts soldered onto substrate test board,
apply force to the test board for a deflection
of 1 mm. AECQ-200 rev. C Method 005
Capacitance Change
Refer to Standard Ratings Table
Dissipation Factor
Initial specified value or less
Leakage Current
Initial specified value or less
Vibration
MIL-STD-202G, Method 204D,
10 Hz to 2000 Hz, 20G peak
Capacitance Change
Refer to Standard Ratings Table
Dissipation Factor
Initial specified value or less
Leakage Current
Initial specified value or less
There shall be no mechanical or visual damage to capacitors
post-conditioning.
Shock
Mil-Std-202G, Method 213B, Condition I,
100G peak
Capacitance Change
Refer to Standard Ratings Table
Dissipation Factor
Initial specified value or less
Leakage Current
Initial specified value or less
There shall be no mechanical or visual damage to capacitors
post-conditioning.


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