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AD7846JP Datenblatt(PDF) 4 Page - Analog Devices |
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AD7846JP Datenblatt(HTML) 4 Page - Analog Devices |
4 / 16 page REV. E –4– AD7846 ORDERING GUIDE Model Temperature Range Relative Accuracy Package Description Package Options AD7846JN 0 °C to +70°C ±16 LSB Plastic DIP N-28A AD7846KN 0 °C to +70°C ±8 LSB Plastic DIP N-28A AD7846JP 0 °C to +70°C ±16 LSB Plastic Leaded Chip Carrier (PLCC) P-28A AD7846KP 0 °C to +70°C ±8 LSB Plastic Leaded Chip Carrier (PLCC) P-28A AD7846AP –40 °C to +85°C ±16 LSB Plastic Leaded Chip Carrier (PLCC) P-28A AD7846AQ –40 °C to +85°C ±16 LSB Ceramic DIP Q-28 AD7846BP –40 °C to +85°C ±8 LSB Plastic Leaded Chip Carrier (PLCC) P-28A ABSOLUTE MAXIMUM RATINGS 1 VDD to DGND . . . . . . . . . . . . . . . . . . . . . . . . . –0.4 V to +17 V VCC to DGND . . . . . . . . . . . . . . . –0.4 V, VDD + 0.4 V or +7 V (Whichever Is Lower) VSS to DGND . . . . . . . . . . . . . . . . . . . . . . . . . +0.4 V to –17 V VREF+ to DGND . . . . . . . . . . . . . . . . VDD + 0.4 V, VSS – 0.4 V VREF– to DGND . . . . . . . . . . . . . . . . VDD + 0.4 V, VSS – 0.4 V VOUT to DGND 2 . . . . . . . . VDD + 0.4 V, VSS – 0.4 V or ±10 V (Whichever Is Lower) RIN to DGND . . . . . . . . . . . . . . . . . . VDD + 0.4 V, VSS – 0.4 V Digital Input Voltage to DGND . . . . . . –0.4 V to VCC + 0.4 V Digital Output Voltage to DGND . . . . . –0.4 V to VCC + 0.4 V Power Dissipation (Any Package) To +75 °C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1000 mW Derates above +75 °C . . . . . . . . . . . . . . . . . . . . . 10 mW/°C Operating Temperature Range J, K Versions . . . . . . . . . . . . . . . . . . . . . . . . . 0 °C to +70°C A, B Versions . . . . . . . . . . . . . . . . . . . . . . . –25 °C to +85°C Storage Temperature Range . . . . . . . . . . . . –65 °C to +150°C Lead Temperature (Soldering) . . . . . . . . . . . . . . . . . . +300 °C NOTES 1Stresses above those listed under Absolute Maximum Ratings may cause perma- nent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. Only one Absolute Maximum Rating may be applied at any one time. 2V OUT may be shorted to DGND, VDD, VSS, VCC provided that the power dissipation of the package is not exceeded. CAUTION ESD (electrostatic discharge) sensitive device. The digital control inputs are diode protected; however, permanent damage may occur on unconnected devices subject to high energy electro- static fields. Unused devices must be stored in conductive foam or shunts. The protective foam should be discharged to the destination socket before devices are removed. TERMINOLOGY LEAST SIGNIFICANT BIT This is the analog weighting of 1 bit of the digital word in a DAC. For the AD7846, 1 LSB = (VREF+ –VREF–)/2 16. Relative Accuracy Relative accuracy or endpoint nonlinearity is a measure of the maximum deviation from a straight line passing through the end- points of the DAC transfer function. It is measured after adjust- ing for both endpoints (i.e., offset and gain errors are adjusted out) and is normally expressed in least significant bits or as a percentage of full-scale range. Differential Nonlinearity Differential nonlinearity is the difference between the measured change and the ideal change between any two adjacent codes. A specified differential nonlinearity of ±1 LSB over the operating temperature range ensures monotonicity. Gain Error Gain error is a measure of the output error between an ideal DAC and the actual device output with all 1s loaded after offset error has been adjusted out. Gain error is adjustable to zero with an external potentiometer. Offset Error This is the error present at the device output with all 0s loaded in the DAC. It is due to op amp input offset voltage and bias current and the DAC leakage current. Bipolar Zero Error When the AD7846 is connected for bipolar output and 10 . . . 000 is loaded to the DAC, the deviation of the analog output from the ideal midscale of 0 V is called the bipolar zero error. Digital-to-Analog Glitch Impulse This is the amount of charge injected from the digital inputs to the analog output when the inputs change state. This is normally specified as the area of the glitch in either pA-secs or nV-secs depending upon whether the glitch is measured as a current or a voltage. Multiplying Feedthrough Error This is an ac error due to capacitive feedthrough from either of the VREF terminals to VOUT when the DAC is loaded with all 0s. Digital Feedthrough When the DAC is not selected (i.e., CS is held high), high fre- quency logic activity on the digital inputs is capacitively coupled through the device to show up as noise on the VOUT pin. This noise is digital feedthrough. WARNING! ESD SENSITIVE DEVICE |
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