ABSOLUTE MAXIMUM RATINGS

(1)

ADS8556

ADS8557

ADS8558

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

RESOLUTION

PACKAGE-

PACKAGE

ORDERING

TRANSPORT

PRODUCT

(Bits)

LEAD

DESIGNATOR

NUMBER

MEDIA, QUANTITY

ADS8556IPM

Tray, 160

ADS8556I

16

LQFP-64

PM

ADS8556IPMR

Tape and Reel, 1000

ADS8557IPM

Tray, 160

ADS8557I

14

LQFP-64

PM

ADS8557IPMR

Tape and Reel, 1000

ADS8558IPM

Tray, 160

ADS8558I

12

LQFP-64

PM

ADS8558IPMR

Tape and Reel, 1000

(1)

For the most current package and ordering information see the Package Option Addendum at the end of this document, or see the TI

web site at www.ti.com.

Over operating free-air temperature range, unless otherwise noted.

ADS8556, ADS8557, ADS8558

UNIT

Supply voltage, HVDD to AGND

–0.3 to +18

V

Supply voltage, HVSS to AGND

–18 to +0.3

V

Supply voltage, AVDD to AGND

–0.3 to +6

V

Supply voltage, BVDD to BGND

–0.3 to +6

V

Analog input voltage

HVSS – 0.3 to HVDD + 0.3

V

Reference input voltage with respect to AGND

AGND – 0.3 to AVDD + 0.3

V

Digital input voltage with respect to BGND

BGND – 0.3 to BVDD + 0.3

V

Ground voltage difference AGND to BGND

±0.3

V

Input current to all pins except supply

–10 to +10

mA

+150

°C

Human body model (HBM)

±2000

V

JEDEC standard 22, test method A114-C.01, all pins

ESD ratings

Charged device model (CDM)

±500

V

JEDEC standard 22, test method C101, all pins

(1)

Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings

only and functional operation of the device at these or any other conditions beyond those indicated under recommended operating

conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

2

Copyright © 2006–2009, Texas Instruments Incorporated

Product Folder Link(s): ADS8556 ADS8557 ADS8558