Datenblatt-Suchmaschine für elektronische Bauteile |
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LFD4K5-63-XX-S4-PF Datenblatt(PDF) 9 Page - LIGITEK electronics co., ltd. |
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LFD4K5-63-XX-S4-PF Datenblatt(HTML) 9 Page - LIGITEK electronics co., ltd. |
9 / 9 page Thermal Shock Test MIL-STD-202: 107D MIL-STD-750: 1051 MIL-STD-883: 1011 1.Ta=105 ℃±5℃&-40℃±5℃ (10min) (10min) 2.total 10 cycles The purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. MIL-STD-202: 208D MIL-STD-750: 2026 MIL-STD-883: 2003 JIS C 7021: A-2 MIL-STD-202: 210A MIL-STD-750: 2031 JIS C 7021: A-1 1.T.Sol=260 ℃±5℃ 2.Dwell time= 10 ±1sec. 1.T.Sol=230 ℃±5℃ 2.Dwell time=5 ±1sec Solderability Test Solder Resistance Test This test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. This test intended to see soldering well performed or not. LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only JIS C 7021: B-12 MIL-STD-750: 1026 MIL-STD-883: 1005 JIS C 7021: B-1 MIL-STD-883:1008 JIS C 7021: B-10 MIL-STD-202:103B JIS C 7021: B-11 Reliability Test: 1.Ta=-40 ℃±5℃ 2.t=1000 hrs (-24hrs, +72hrs) 1.Ta=65 ℃±5℃ 2.RH=90 %~95% 3.t=240hrs ±2hrs 1.Ta=105 ℃±5℃ 2.t=1000 hrs (-24hrs, +72hrs) 1.Under Room Temperature 2.If=10mA 3.t=1000 hrs (-24hrs, +72hrs) Test Condition High Temperature Storage Test Low Temperature Storage Test High Temperature High Humidity Test Operating Life Test Test Item The purpose of this is the resistance of the device which is laid under condition of high temperature for hours. The purpose of this is the resistance of the device which is laid under condition of low temperature for hours. The purpose of this test is the resistance of the device under tropical for hours. This test is conducted for the purpose of detemining the resistance of a part in electrical and themal stressed. Description Reference Standard Page 8/8 PART NO. LFD4K5/63-XX/S4-PF |
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