Datenblatt-Suchmaschine für elektronische Bauteile |
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HCPL0700 Datenblatt(PDF) 8 Page - Fairchild Semiconductor |
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HCPL0700 Datenblatt(HTML) 8 Page - Fairchild Semiconductor |
8 / 13 page ©2003 Fairchild Semiconductor Corporation www.fairchildsemi.com HCPL0700, HCPL0701, HCPL0730, HCPL0731 Rev. 1.0.1 8 Test Circuits Fig. 15 Common Mode Immunity Test Circuit T T Fig. 14 Switching Time Test Circuit T T PLH OL VO VO 5 V 1.5 V F I 1.5 V T PHL T 4 5 Noise 1 2 Shield 8 7 6 +5 V O V VCC V01 V02 GND VF1 - + F2 V F I + 10% DUTY CYCLE I/f < 100 µS F I MONITOR L 0.1 µF Pulse Generator tr = 5ns Z = 50 O V 3 I Monitor F 4 I/ < 100 µs tr = 5ns Generator Pulse Z = 50 f O VF V V I V F 2 1 VO V V O 6 5 GND 7 8 VO B VB L R CC VC +5 V 0.1 µF C = 15 pF* L Test Circuit for HCPL-0730 and HCPL-0731 Test Circuit for HCPL-0700 and HCPL-0701 Test Circuit for HCPL-0730 and HCPL-0731 Test Circuit for HCPL-0700 and HCPL-0701 m R Rm Shield Noise - C = 15 pF* Pulse Gen CM VC VFF V V B A + - +5 V O V - IF 3 4 F VF 2 1 Shield Noise 6 O 5 GND 7 8 VO B VB CC VC L R Switch at A : I = 0 mA F Switch at B : I = 1.6 mA F tr VO O V OL V 5 V 0 V 10% 10% 90% CM V 10 V CM C GND + - F2 V VF1 - +5 V CC V L V02 V R 01 VO VCM V V A B Pulse Gen F I + - + 0.1 µF f t FF VF 90% 1 3 4 2 Shield Noise 8 6 5 7 0.1 µF |
Ähnliche Teilenummer - HCPL0700 |
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Ähnliche Beschreibung - HCPL0700 |
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