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74HC73D Datenblatt(PDF) 9 Page - NXP Semiconductors |
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74HC73D Datenblatt(HTML) 9 Page - NXP Semiconductors |
9 / 16 page 74HC73_4 © NXP B.V. 2008. All rights reserved. Product data sheet Rev. 04 — 19 March 2008 9 of 16 NXP Semiconductors 74HC73 Dual JK flip-flop with reset; negative-edge trigger Table 8. Measurement points Type Input Output VI VM VM 74HC73 VCC 0.5VCC 0.5VCC Test data is given in Table 9. Definitions for test circuit: RT = Termination resistance should be equal to output impedance Zo of the pulse generator. CL = Load capacitance including jig and probe capacitance. Fig 8. Test circuit for measuring switching times 001aah768 tW tW tr tr tf VM VI negative pulse GND VI positive pulse GND 10 % 90 % 90 % 10 % VM VM VM tf VCC DUT RT VI VO CL G Table 9. Test data Type Input Load VI tr, tf CL 74HC73 VCC 6 ns 15 pF, 50 pF |
Ähnliche Teilenummer - 74HC73D |
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Ähnliche Beschreibung - 74HC73D |
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