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74LVC3G34GD Datenblatt(PDF) 8 Page - NXP Semiconductors

Teilenummer 74LVC3G34GD
Bauteilbeschribung  Triple buffer
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Hersteller  NXP [NXP Semiconductors]
Direct Link  http://www.nxp.com
Logo NXP - NXP Semiconductors

74LVC3G34GD Datenblatt(HTML) 8 Page - NXP Semiconductors

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74LVC3G34_7
© NXP B.V. 2008. All rights reserved.
Product data sheet
Rev. 07 — 9 May 2008
8 of 16
NXP Semiconductors
74LVC3G34
Triple buffer
12. AC waveforms
Measurement points are given in Table 9.
Logic levels: VOL and VOH are typical output voltage
levels that occur with the output load.
Test data is given in Table 10.
Definitions for test circuit:
RL = Load resistance.
CL = Load capacitance including jig and probe
capacitance.
RT = Termination resistance should be equal to the
output impedance Zo of the pulse generator.
VEXT = External voltage for measuring switching times.
Fig 8.
The data input (nA) to output (nY) propagation
delays
Fig 9.
Test circuit for measuring switching times
mnb072
nA input
nY output
tPLH
tPHL
GND
VI
VM
VM
VM
VM
VOH
VOL
VEXT
VCC
VI
VO
mna616
DUT
CL
RT
RL
RL
G
Table 9.
Measurement points
Supply voltage
Input
Output
VCC
VM
VM
1.65 V to 1.95 V
0.5
× V
CC
0.5
× V
CC
2.3 V to 2.7 V
0.5
× V
CC
0.5
× V
CC
2.7 V
1.5 V
1.5 V
3.0 V to 3.6 V
1.5 V
1.5 V
4.5 V to 5.5 V
0.5
× VCC
0.5
× V
CC
Table 10.
Test data
Supply voltage
Input
Load
VEXT
VCC
VI
tr =tf
CL
RL
tPLH, tPHL
1.65 V to 1.95 V
VCC
≤ 2.0 ns
30 pF
1 k
open
2.3 V to 2.7 V
VCC
≤ 2.0 ns
30 pF
500
open
2.7 V
2.7 V
≤ 2.5 ns
50 pF
500
open
3.0 V to 3.6 V
2.7 V
≤ 2.5 ns
50 pF
500
open
4.5 V to 5.5 V
VCC
≤ 2.5 ns
50 pF
500
open


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