TPA6012A4

SLOS636 – OCTOBER 2009

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This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

AVAILABLE OPTIONS

PACKAGE

24-PIN TSSOP (PWP)

–40°C to 85°C

TPA6012A4PWP

ABSOLUTE MAXIMUM RATINGS

over operating free-air temperature range (unless otherwise noted)

(1)

UNIT

–0.3 V to 6 V

Input voltage, RIN+, RIN–, LIN+,LIN–

Continuous total power dissipation

See Dissipation Rating Table

Operating free-air temperature range

–40°C to 85°C

Operating junction temperature range

–40°C to 150°C

Storage temperature range

–65°C to 85°C

(1)

Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings

only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating

conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

DISSIPATION RATING TABLE

(1)

DERATING FACTOR

PACKAGE

POWER RATING

POWER RATING

POWER RATING

PWP

2.7 mW

21.8 mW/°C

1.7 W

1.4 W

(1)

All characterization is done using an external heatsink with

is 22.2 mW/°C.

2

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