Datenblatt-Suchmaschine für elektronische Bauteile |
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STB270N4F3 Datenblatt(PDF) 8 Page - STMicroelectronics |
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STB270N4F3 Datenblatt(HTML) 8 Page - STMicroelectronics |
8 / 14 page Test circuit STB270N4F3, STI270N4F3 8/14 Doc ID 13208 Rev 4 3 Test circuit Figure 13. Switching times test circuit for resistive load Figure 14. Gate charge test circuit Figure 15. Test circuit for inductive load switching and diode recovery times Figure 16. Unclamped inductive load test circuit Figure 17. Unclamped inductive waveform Figure 18. Switching time waveform AM01468v1 VGS PW VD RG RL D.U.T. 2200 µF 3.3 µF VDD AM01469v1 VDD 47k Ω 1k Ω 47k Ω 2.7k Ω 1k Ω 12V Vi=20V=VGMAX 2200 µF PW IG=CONST 100 Ω 100nF D.U.T. VG AM01470v1 A D D.U.T. S B G 25 Ω A A B B RG G FAST DIODE D S L=100 µH µF 3.3 1000 µF VDD AM01471v1 Vi Pw VD ID D.U.T. L 2200 µF 3.3 µF VDD AM01472v1 V(BR)DSS VDD VDD VD IDM ID AM01473v1 VDS ton tdon tdoff toff tf tr 90% 10% 10% 0 0 90% 90% 10% VGS |
Ähnliche Teilenummer - STB270N4F3_09 |
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Ähnliche Beschreibung - STB270N4F3_09 |
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