Datenblatt-Suchmaschine für elektronische Bauteile |
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Si1141-A10-GM Datenblatt(PDF) 5 Page - Silicon Laboratories |
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Si1141-A10-GM Datenblatt(HTML) 5 Page - Silicon Laboratories |
5 / 66 page Si11 41/42/43 Preliminary Rev. 0.5 5 Table 3. Performance Characteristics1 Parameter Symbol Conditions Min Typ Max Units IDD OFF Mode Ioff VDD < VDD_OFF (leakage from SCL, SDA, and INT not included) — 240 1000 nA IDD Standby Mode Isb No ALS / PS Conversions No I2C Activity after t > TBD µs, VDD =1.8 V — 150 500 nA IDD Standby Mode Isb No ALS / PS Conversions No I2C Activity after t > TBD µs, VDD =3.3 V —1.83 — µA IDD Actively Measuring Iactive Without LED influence, VDD = 3.3 V — 4.3 5.2 mA Peak IDD while LED1, LED2, or LED3 is Actively Driven VDD =3.3 V — 8 — mA LED1, LED2, LED3, Saturation Voltage2 1.8< VDD<2.4, ILEDx<100 mA 1.8<VDD<2.4, ILEDx< 200 mA 2.4<VDD<3.6, ILEDx<200 mA 2.4<VDD<3.6, ILEDx<359 mA — — — — 0.3 0.5 0.3 0.5 — — — — V LED1, LED2, LED3 Pulse Width tPS —25.6 30 µs LED1, LED2, LED3 Leakage Current VDD =3.3 V, VLEDx<3.0, no strobe VDD = 3.3 V, 3.0<VLEDx< 5.0, no strobe — — .01 1.0 5.0 5.0 µA Notes: 1. Unless specifically stated in "Conditions", electrical data assumes ambient light levels < 1 klx. 2. Proximity-detection performance may be degraded, especially when there is high optical crosstalk, if the LED supply and voltage drop allow the driver to saturate and current regulation is lost. 3. Represents the time during which the device is drawing a current equal to Iactive for power estimation purposes. Assumes default settings. 4. Applies to single 25.6 µs pulse measurement. By increasing irLED pulse width, 0.001 µW/cm2 under low light is possible. 5. ALS Sensitivity under low light conditions can be improved by increasing ADC integration time. 10 mlx resolution possible under the highest ADC integration time setting. |
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