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MCP14E7 Datenblatt(PDF) 5 Page - Microchip Technology

Teilenummer MCP14E7
Bauteilbeschribung  2.0A Dual High-Speed Power MOSFET Driver With Enable
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Hersteller  MICROCHIP [Microchip Technology]
Direct Link  http://www.microchip.com
Logo MICROCHIP - Microchip Technology

MCP14E7 Datenblatt(HTML) 5 Page - Microchip Technology

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© 2011 Microchip Technology Inc.
DS25006A-page 5
MCP14E6/7/8
Enable Function (ENB_A, ENB_B)
High-Level Input Voltage
VEN_H
2.4
V
VDD = 12V, Low-to-High Transition
Low-Level Input Voltage
VEN_L
——
0.8
V
VDD = 12V, High-to-Low Transition
Hysteresis
VHYST
—0.4
V
Enable Pull-up Impedance
RENBL
0.7
1.6
3.0
M
Ω
VDD =14V,
ENB_A = ENB_B = GND
Propagation Delay Time
tD3
—60
80
ns
VDD =12V, Figure 4-3
Propagation Delay Time
tD4
—70
85
ns
VDD =12V, Figure 4-3
Power Supply
Supply Voltage
VDD
4.5
18.0
V
Supply Current
IDD
1400
2200
µA
VIN_A =3V, VIN_B =3V,
ENB_A = ENB_B = High
IDD
—800
1100
µA
VIN_A =0V, VIN_B =0V,
ENB_A = ENB_B = High
IDD
1300
2000
µA
VIN_A =3V, VIN_B =0V,
ENB_A = ENB_B = High
IDD
1300
2000
µA
VIN_A =0V, VIN_B =3V,
ENB_A = ENB_B = High
IDD
800
1200
µA
VIN_A =3V, VIN_B =3V,
ENB_A = ENB_B = Low
IDD
500
600
µA
VIN_A =0V, VIN_B =0V,
ENB_A = ENB_B = Low
IDD
600
900
µA
VIN_A =3V, VIN_B =0V,
ENB_A = ENB_B = Low
IDD
600
900
µA
VIN_A =0V, VIN_B =3V,
ENB_A = ENB_B = Low
TEMPERATURE CHARACTERISTICS
Electrical Specifications:
Unless otherwise noted, all parameters apply with 4.5V
≤ VDD ≤ 18V.
Parameters
Sym
Min
Typ
Max
Units
Conditions
Temperature Ranges
Specified Temperature Range
TA
-40
+125
°C
Maximum Junction Temperature
TJ
——
+150
°C
Storage Temperature Range
TA
-65
+150
°C
Package Thermal Resistances
Thermal Resistance, 8L-6x5 DFN
θJA
35.7
°C/W
Typical four-layer board with
vias to ground plane
Thermal Resistance, 8L-PDIP
θJA
—89.3
°C/W
Thermal Resistance, 8L-SOIC
θJA
—149.5
°C/W
DC CHARACTERISTICS (OVER OPERATING TEMP. RANGE)(2) (CONTINUED)
Electrical Specifications:
Unless otherwise indicated, operating temperature range with 4.5V
≤ VDD ≤ 18V.
Parameters
Sym
Min
Typ
Max
Units
Conditions
Note 1:
Switching times are ensured by design.
2:
Tested during characterization, not production tested.


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