Datenblatt-Suchmaschine für elektronische Bauteile |
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MCM62Y308J17 Datenblatt(PDF) 3 Page - Motorola, Inc |
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MCM62Y308J17 Datenblatt(HTML) 3 Page - Motorola, Inc |
3 / 16 page MCM62Y308 3 MOTOROLA FAST SRAM PIN DESCRIPTIONS SOJ Pin Locations Symbol Type Description 11 K Input CLOCK – System clock input pin accepting a minimum 8 ns clock high or clock low pulse at a minimum 20 ns clock cycle. All other synchronous inputs excluding the test access port are captured on the rising edge of this signal. 12 WE Input WRITE ENABLE – Write enable is captured on K leading edge. When asserted this causes the input data D0 – D7 to be written into the RAM address controlled by the write address counter and increments the counter for the next write. 21 RE Input READ ENABLE – Read enable is captured on K leading edge. When asserted increments the counter for the next read operation. This causes a RAM read access from address controlled by the read address counter to be inserted in the output register Q0 – Q7. 13 WR Input WRITE RELOAD – Write reload is captured on K leading edge. When asserted this causes the write address counter to be initialized to the contents of the write reload register or “cleared” as specified by control register bit 3. See control register bit 3 for “cleared” description. 20 RR Input READ RELOAD – Read reload is captured on K leading edge. When asserted this causes the read address counter to be initialized to the contents of the read reload register or “cleared” as specified by control register bit 5. See control register bit 5 for “cleared” description. 22 G Input OUTPUT ENABLE – When asserted low causes the outputs Q0 – Q7 to become active and when deasserted high causes them to High–Z. This pin can be either synchronous with K leading edge or asynchronous as specified by control register bit 7. 9, 8, 7, 6, 5, 4, 3, 2 D0 – D7 Input DATA INPUT – The levels on these pins are captured on the K leading edge. The value captured will be written into the RAM if WE is also asserted and the expand ID bits match the upper three bits of the write address counter. 24, 25, 26, 27, 28, 29, 30, 31 Q0 – Q7 Output DATA OUTPUT – Data outputs are available from the read output register < 15 ns from the rising edge of K when RE or RR is asserted. outputs are disabled when the upper three bits of the read address counter do not match the three expand ID bits of the control register. G will also control the disabling of the outputs either synchronously or asynchronously. See G description. 17, 32 RRF, WRF Output ROLL–OVER FLAG – These signals are asserted high on the clock cycle where the address counters (write address counter for WRF and read address counter for RRF) roll–over to 0000 during count down. During count up these pins must be treated as don’t cares. 16, 1 RRR, WRR Input ROLL–OVER RESET – The level on these pins is captured on the K leading edge. When asserted low, each will reset their associated roll–over flag output. TEST ACCESS PORT PIN DESCRIPTIONS (The Test Access Port Conforms with the IEEE Standard 1149.1. It is also Used to Load Device Specific Registers Used to Configure the MCM62Y308.) SOJ Pin Locations Symbol Type Description 15 TCK Input TEST CLOCK – Samples and clocks all TAP events. All inputs are captured on TCK rising edge and all outputs propagate from TCK falling edge. It also can take the place of K in device operation in certain test conditions. 18 TMS Input TEST MODE SELECT – Sampled on the rising edge of TCK. Determines the movement through the TAP state machine (Figure 2). This circuit is designed in such a way that an undriven input will produce a response identical to the application of a logic 1. 14 TDI Input TEST DATA IN – Sampled on the rising edge of TCK. This is the input side of the serial register placed between TDI and TDO. The register placed between TDI and TDO is determined by the state of the TAP state machine and what instruction is active in the TAP instruction register. This circuit is designed in such a way that an undriven input will produce a response identical to the application of a logic 1. 19 TDO Output TEST DATA OUT – Output that is active depending on the state of the TAP state machine. Output changes off the trailing edge of TCK. This is the output side of the serial register placed between TDI and TDO. |
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