Datenblatt-Suchmaschine für elektronische Bauteile |
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MCM6323AYJ15R Datenblatt(PDF) 4 Page - Motorola, Inc |
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MCM6323AYJ15R Datenblatt(HTML) 4 Page - Motorola, Inc |
4 / 12 page MCM6323A 4 MOTOROLA FAST SRAM AC OPERATING CONDITIONS AND CHARACTERISTICS (VDD = 3.3 V ± 0.3 V, TA = 0 to +70°C, Unless Otherwise Noted) (TA = – 40 to + 85°C for Industrial Temperature Offering) Logic Input Timing Measurement Reference Level 1.50 V . . . . . . . . Logic Input Pulse Levels 0 to 3.0 V . . . . . . . . . . . . . . . . . . . . . . . . . . . . Input Rise/Fall Time 2 ns . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Output Timing Reference Level 1.50 V . . . . . . . . . . . . . . . . . . . . . . . . . Output Load See Figure 1 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . READ CYCLE TIMING (See Notes 1, 2, 3, and 4) P Sb l MCM6323A–10 MCM6323A–12 MCM6323A–15 Ui N Parameter Symbol Min Max Min Max Min Max Unit Notes Read Cycle Time tAVAV 10 — 12 — 15 — ns 5 Address Access Time tAVQV — 10 — 12 — 15 ns Enable Access Time tELQV — 10 — 12 — 15 ns Output Enable Access Time tGLQV — 4 — 5 — 6 ns 6 Output Hold from Address Change tAXQX 3 — 3 — 3 — ns Enable Low to Output Active tELQX 3 — 3 — 3 — ns 6, 7, 8 Output Enable Low to Output Active tGLQX 0 — 0 — 0 — ns 6, 7, 8 Enable High to Output High–Z tEHQZ — 4 — 5 — 6 ns 6, 7, 8 Output Enable High to Output High–Z tGHQZ — 4 — 5 — 6 ns 6, 7, 8 Byte Enable Access Time tBLQV — 4 — 5 — 6 ns Byte Enable Low to Output Active tBLQX 0 — 0 — 0 — ns 6, 7, 8 Byte High to Output High–Z tBHQZ 0 5 0 5 0 5 ns 6, 7, 8 NOTES: 1. W is high for read cycle. 2. For common I/O applications, minimization, or elimination of bus contention conditions is necessary during read and write cycles. 3. Device is continuously selected (E = VIL, G = VIL, and LB and/or UB = VIL). 4. Addresses valid prior to or coincident with E going low. 5. All read cycle timings are referenced from the last valid address to the first transitioning address. 6. Transition is measured 200 mV from steady–state voltage. 7. At any given voltage and temperature, tEHQZ (max) < tELQX (min), and tGHQZ (max) < tGLQX (min), both for a given device and from device to device. 8. This parameter is sampled and not 100% tested. |
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