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DAC714HC Datenblatt(PDF) 2 Page - Texas Instruments

Teilenummer DAC714HC
Bauteilbeschribung  16-Bit DIGITAL-TO-ANALOG CONVERTER With Serial Data Interface
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Hersteller  TI1 [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI1 - Texas Instruments

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DAC714
2
SBAS032A
www.ti.com
PIN CONFIGURATION
Top View
CLK
A
0
A
1
SDI
SDO
DCOM
+V
CC
ACOM
DAC714
CLR
–V
CC
Gain Adjust
Offset Adjust
V
REF OUT
R
BPO
R
FB2
V
OUT
1
2
3
4
5
6
7
8
16
15
14
13
12
11
10
9
PIN DESCRIPTIONS
PIN
LABEL
DESCRIPTION
1
CLK
Serial Data Clock
2A0
Enable for Input Register (Active Low)
3A1
Enable for D/A Latch (Active Low)
4
SDI
Serial Data Input
5
SDO
Serial Data Output
6
DCOM
Digital Ground
7+VCC
Positive Power Supply
8
ACOM
Analog Ground
9VOUT
D/A Output
10
RFB2
±10V Range Feedback Output
11
RBPO
Bipolar Offset
12
VREF OUT
Voltage Reference Output
13
Offset Adjust
Offset Adjust
14
Gain Adjust
Gain Adjust
15
–VCC
Negative Power Supply
16
CLR
Clear
SO/DIP
+VCC to Common .................................................................... 0V to +17V
–VCC to Common .................................................................... 0V to –17V
+VCC to –VCC ....................................................................................... 34V
ACOM to DCOM ...............................................................................
±0.5V
Digital Inputs to Common ............................................. –1V to (VCC –0.7V)
External Voltage Applied to BPO and Range Resistors ....................
±V
CC
VREF OUT .......................................................... Indefinite Short to Common
VOUT ............................................................... Indefinite Short to Common
SDO ............................................................... Indefinite Short to Common
Power Dissipation .......................................................................... 750mW
Storage Temperature ...................................................... –60
°C to +150°C
Lead Temperature (soldering, 10s) ............................................... +300
°C
NOTE: (1) Stresses above those listed under
Absolute Maximum Ratings may
cause permanent damage to the device. Exposure to absolute maximum
conditions for extended periods may affect device reliability.
ABSOLUTE MAXIMUM RATINGS(1)
ELECTROSTATIC
DISCHARGE SENSITIVITY
This integrated circuit can be damaged by ESD. Texas Instru-
ments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling
and installation procedures can cause damage.
ESD damage can range from subtle performance degradation
to complete device failure. Precision integrated circuits may be
more susceptible to damage because very small parametric
changes could cause the device not to meet its published
specifications.
For the most current package and ordering information, see
the Package Option Addendum at the end of this document,
or see the TI website at www.ti.com.
PACKAGE/ORDERING INFORMATION


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