Datenblatt-Suchmaschine für elektronische Bauteile |
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SN74AUC34RGYR Datenblatt(PDF) 1 Page - Texas Instruments |
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SN74AUC34RGYR Datenblatt(HTML) 1 Page - Texas Instruments |
1 / 11 page www.ti.com FEATURES RGY PACKAGE (TOP VIEW) 1 14 7 8 2 3 4 5 6 13 12 11 10 9 6A 6Y 5A 5Y 4A 1Y 2A 2Y 3A 3Y DESCRIPTION/ORDERING INFORMATION A Y SN74AUC34 HEX BUFFER GATE SCES474 – AUGUST 2003 – REVISED OCTOBER 2005 • Optimized for 1.8-V Operation and Is 3.6-V I/O Tolerant to Support Mixed-Mode Signal Operation • Ioff Supports Partial-Power-Down Mode Operation • Sub-1-V Operable • Max tpd of 1.8 ns at 1.8 V • Low Power Consumption, 10- µA Max I CC • ±8-mA Output Drive at 1.8 V • Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II • ESD Protection Exceeds JESD 22 – 2000-V Human-Body Model (A114-A) – 200-V Machine Model (A115-A) – 1000-V Charged-Device Model (C101) This hex buffer gate is operational at 0.8-V to 2.7-V VCC, but is designed specifically for 1.65-V to 1.95-V VCC operation. The SN74AUC34 performs the Boolean function Y = A. This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs, preventing damaging current backflow through the device when it is powered down. ORDERING INFORMATION TA PACKAGE(1) ORDERABLE PART NUMBER TOP-SIDE MARKING –40 °C to 85°C QFN – RGY Tape and reel SN74AUC34RGYR MS34 (1) Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at www.ti.com/sc/package. FUNCTION TABLE (EACH GATE) INPUT OUTPUT A Y H H L L LOGIC DIAGRAM, EACH GATE (POSITIVE LOGIC) Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. PRODUCTION DATA information is current as of publication date. Copyright © 2003–2005, Texas Instruments Incorporated Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. |
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