Datenblatt-Suchmaschine für elektronische Bauteile |
|
AD5142BRUZ100 Datenblatt(PDF) 8 Page - Analog Devices |
|
AD5142BRUZ100 Datenblatt(HTML) 8 Page - Analog Devices |
8 / 32 page AD5122/AD5142 Data Sheet Rev. 0 | Page 8 of 32 Parameter Symbol Test Conditions/Comments Min Typ1 Max Unit DYNAMIC CHARACTERISTICS9 Bandwidth BW −3 dB R AB = 10 kΩ 3 MHz R AB = 100 kΩ 0.43 MHz Total Harmonic Distortion THD V DD/VSS = ±2.5 V, VA = 1 V rms, V B = 0 V, f = 1 kHz R AB = 10 kΩ −80 dB R AB = 100 kΩ −90 dB Resistor Noise Density e N_WB Code = half scale, T A = 25°C, f = 10 kHz R AB = 10 kΩ 7 nV/√Hz R AB = 100 kΩ 20 nV/√Hz V W Settling Time t S V A = 5 V, VB = 0 V, from zero scale to full scale, ±0.5 LSB error band R AB = 10 kΩ 2 µs R AB = 100 kΩ 12 µs Crosstalk (C W1/CW2) C T R AB = 10 kΩ 10 nV-sec R AB = 100 kΩ 25 nV-sec Analog Crosstalk C TA −90 dB Endurance10 T A = 25°C 1 Mcycles 100 kcycles Data Retention11 50 Years 1 Typical values represent average readings at 25°C, V DD = 5 V, VSS = 0 V, and VLOGIC = 5 V. 2 Resistor integral nonlinearity (R-INL) error is the deviation from an ideal value measured between the maximum resistance and the minimum resistance wiper positions. R-DNL measures the relative step change from ideal between successive tap positions. The maximum wiper current is limited to (0.7 × VDD)/RAB. 3 Guaranteed by design and characterization, not subject to production test. 4 INL and DNL are measured at V WB with the RDAC configured as a potentiometer divider similar to a voltage output DAC. VA = VDD and VB = 0 V. DNL specification limits of ±1 LSB maximum are guaranteed monotonic operating conditions. 5 Resistor Terminal A, Resistor Terminal B, and Resistor Terminal W have no limitations on polarity with respect to each other. Dual-supply operation enables ground referenced bipolar signal adjustment. 6 Different from operating current; supply current for EEPROM program lasts approximately 30 ms. 7 Different from operating current; supply current for EEPROM read lasts approximately 20 µs. 8 P DISS is calculated from (IDD × VDD) + (ILOGIC × VLOGIC). 9 All dynamic characteristics use V DD/VSS = ±2.5 V, and VLOGIC = 2.5 V. 10 Endurance is qualified to 100,000 cycles per JEDEC Standard 22, Method A117 and measured at −40°C to +125°C. 11 Retention lifetime equivalent at junction temperature (TJ) = 125°C per JEDEC Standard 22, Method A117. Retention lifetime, based on an activation energy of 1 eV, derates with junction temperature in the Flash/EE memory. |
Ähnliche Teilenummer - AD5142BRUZ100 |
|
Ähnliche Beschreibung - AD5142BRUZ100 |
|
|
Link URL |
Privatsphäre und Datenschutz |
ALLDATASHEETDE.COM |
War ALLDATASHEET hilfreich? [ DONATE ] |
Über Alldatasheet | Werbung | Kontakt | Privatsphäre und Datenschutz | Linktausch | Hersteller All Rights Reserved©Alldatasheet.com |
Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
Family Site : ic2ic.com |
icmetro.com |