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Datenblatt-Suchmaschine für elektronische Bauteile |
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Datenblatt-Suchmaschine für elektronische Bauteile |
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2N3904BU Datenblatt(PDF) 6 Page - Fairchild Semiconductor |
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2N3904BU Datenblatt(HTML) 6 Page - Fairchild Semiconductor |
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6 / 7 page  © 2011 Fairchild Semiconductor Corporation www.fairchildsemi.com 2N3904 / MMBT3904 / PZT3904 Rev. B0 6 Test Circuits 10 K Ω Ω Ω Ω Ω 3.0 V 275 Ω Ω Ω Ω Ω t 1 C 1 <<<<< 4.0 pF Duty Cycle ===== 2% Duty Cycle ===== 2% <<<<< 1.0 ns - 0.5 V 300 ns 10.6 V 10 <<<<< t 1 < <<<< 500 μμμμμs 10.9 V - 9.1 V <<<<< 1.0 ns 0 0 10 K Ω Ω Ω Ω Ω 3.0 V 275 Ω Ω Ω Ω Ω C 1 <<<<< 4.0 pF 1N916 FIGURE 2: Storage and Fall Time Equivalent Test Circuit FIGURE 1: Delay and Rise Time Equivalent Test Circuit 300ns = < 1.0ns < 4.0pF < 4.0pF < 1.0ns = 10 < t1 < 500 μs Ω Ω k Ω k Ω |
Ähnliche Teilenummer - 2N3904BU |
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Ähnliche Beschreibung - 2N3904BU |
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