4

www.fairchildsemi.com

www.fairchildsemi.com

FM27C256

AC Test Conditions

Output Load

1 TTL Gate and CL = 100 pF (Note 8)

Input Rise and Fall Times

≤ 5 ns

Input Pulse Levels

0.45 to 2.4V

Timing Measurement Reference Level (Note 10)

Inputs

0.8V and 2.0V

Outputs

0.8V and 2.0V

Note 1: Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is stress rating only and functional operation of the

device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for

extended periods may affect device reliability.

Note 2: This parameter is only sampled and is not 100% tested.

Note 3: OE may be delayed up to t

Note 4: The t

Low to TRI-STATE, the measured V

Note 5: TRI-STATE may be attained using OE or CE.

Note 6: The power switching characteristics of EPROMs require careful device decoupling. It is recommended that at least a 0.1

µF ceramic capacitor be used on every device

Note 9: V

Note 10: Inputs and outputs can undershoot to -2.0V for 20 ns Max.

Note 11: CMOS inputs: V

ADDRESSES VALID

VALID OUTPUT

Hi-Z

Hi-Z

2.0V

0.8V

2.0V

0.8V

2.0V

0.8V

2.0V

0.8V

ADDRESSES

CE

OE

OUTPUT

t

OE

(Note 3)

t

ACC

(Note 3)

t

CE

t

CE

(Notes 4, 5)

t

OH

t

DF

(Notes 4, 5)

DS800034-4