Datenblatt-Suchmaschine für elektronische Bauteile |
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DAC7564IAPW Datenblatt(PDF) 2 Page - Texas Instruments |
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DAC7564IAPW Datenblatt(HTML) 2 Page - Texas Instruments |
2 / 51 page DAC7564 SBAS413B – FEBRUARY 2008 – REVISED MAY 2011 www.ti.com This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. PACKAGE/ORDERING INFORMATION(1) RELATIVE DIFFERENTIAL REFERENCE SPECIFIED ACCURACY NONLINEARITY DRIFT PACKAGE- PACKAGE TEMPERATURE PACKAGE PRODUCT (LSB) (LSB) (ppm/ °C) LEAD DESIGNATOR RANGE MARKING DAC7564A ±1 ±0.5 25 TSSOP-16 PW –40°C to +105°C DAC7564 DAC7564C ±1 ±0.5 5 TSSOP-16 PW –40°C to +105°C DAC7564 (1) For the most current package and ordering information see the Package Option Addendum at the end of this document, or see the TI web site at www.ti.com. ABSOLUTE MAXIMUM RATINGS (1) Over operating free-air temperature range (unless otherwise noted). DAC7564 UNIT AVDD to GND –0.3 to +6 V Digital input voltage to GND –0.3 to +VDD + 0.3 V VOUT to GND –0.3 to +VDD + 0.3 V VREF to GND –0.3 to +VDD + 0.3 V Operating temperature range –40 to +125 °C Storage temperature range –65 to +150 °C Junction temperature range (TJ max) +150 °C Power dissipation (TJ max – TA)/θJA W Thermal impedance, θJA +118 °C/W Thermal impedance, θJC +29 °C/W Human body model (HBM) 4000 V ESD rating Charged device model (CDM) 1500 V (1) Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. Exposure to absolute maximum conditions for extended periods may affect device reliability. 2 Copyright © 2008–2011, Texas Instruments Incorporated |
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