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TLP131GB Datenblatt(PDF) 2 Page - Toshiba Semiconductor

Teilenummer TLP131GB
Bauteilbeschribung  Office Machine Programmable Controllers
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Hersteller  TOSHIBA [Toshiba Semiconductor]
Direct Link  http://www.semicon.toshiba.co.jp/eng
Logo TOSHIBA - Toshiba Semiconductor

TLP131GB Datenblatt(HTML) 2 Page - Toshiba Semiconductor

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TLP131
2007-10-01
2
Current Transfer Ratio
Current Transfer
Ratio (%)
(IC / IF)
IF = 5mA, VCE = 5V, Ta = 25°C
Type
Classification
Min.
Max.
Marking Of Classification
(None)
50
600
BLANK, Y, Y
, G, G, B, B, GB
Rank Y
50
150
Y, Y
Rank GR
100
300
G, G
TLP131
Rank GB
100
600
G, G
, B, B, GB
Note: Application type name for certiffication test,please use standard product type name,i.e.
TLP131(GB): TLP131
Absolute Maximum Ratings (Ta = 25°C)
Characteristic
Symbol
Rating
Unit
Forward current
IF
50
mA
Forward current derating (Ta≥53°C)
ΔIF / °C
−0.7
mA / °C
Peak forward current (100μs pulse,100pps)
IFP
1
A
Reverse voltage
VR
5
V
Junction temperature
Tj
125
°C
Collector
−emitter voltage
VCEO
80
V
Collector
−base voltage
VCBO
80
V
Emitter
−collector voltage
VECO
7
V
Emitter
−base voltage
VEBO
7
V
Collector current
IC
50
mA
Peak collector current (10ms pulse,100pps)
ICP
100
mA
Power dissipation
PC
150
mW
Power dissipation derationg (Ta ≥ 25°C)
ΔPC / °C
−1.5
mW / °C
Junction temperature
Tj
125
°C
Storage temperature range
Tstg
−55~125
°C
Operating temperature range
Topr
−55~100
°C
Lead soldering temperature (10s)
Tsol
260
°C
Total package power dissipation
PT
200
mW
Total package power dissipation derating (Ta ≥ 25°C)
ΔPT / °C
−2.0
mW / °C
Isolation voltage (AC, 1min., RH≤ 60%)
(Note 1)
BVS
3750
Vrms
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
(Note 1) Device considered a two terminal device: Pins 1 and 3 shorted together, and pins 4, 5 and 6 shorted
together.


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