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Datenblatt-Suchmaschine für elektronische Bauteile |
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Datenblatt-Suchmaschine für elektronische Bauteile |
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CD74HCT4067ME4 Datenblatt(PDF) 7 Page - Texas Instruments |
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CD74HCT4067ME4 Datenblatt(HTML) 7 Page - Texas Instruments |
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7 / 16 page  7 Analog Test Circuits FIGURE 4. FREQUENCY RESPONSE TEST CIRCUIT FIGURE 5. SINE WAVE DISTORTION TEST CIRCUIT FIGURE 6. CONTROL-TO-SWITCH FEEDTHROUGH NOISE TEST CIRCUIT FIGURE 7. SWITCH OFF SIGNAL FEEDTHROUGH TEST CIRCUIT Test Circuits and Waveforms FIGURE 8. HC TRANSITION TIMES AND PROPAGATION DELAY TIMES, COMBINATION LOGIC FIGURE 9. HCT TRANSITION TIMES AND PROPAGATION DELAY TIMES, COMBINATION LOGIC VCC VIS 0.1 µF 50 Ω 10pF VCC/2 VOS SWITCH ON dB METER VCC VIS 10 µF 10k Ω 50pF VCC/2 VOS SWITCH ON DISTORTION METER fIS = 1kHz TO 10kHz SINE WAVE SWITCH ALTERNATING ON AND OFF tr, tf ≤ 6ns fCONT = 1MHz 50% DUTY CYCLE SCOPE VOS 10pF 600 Ω VCC/2 600 Ω VCC VCC VIS 0.1 µF RC VCC/2 VOS SWITCH OFF dB METER R VCC/2 VC = VIL fIS ≥ 1MHz SINEWAVE R = 50 Ω C = 10pF tPHL tPLH tTHL tTLH 90% 50% 10% 50% 10% INVERTING OUTPUT INPUT GND VCC tr = 6ns tf = 6ns 90% tPHL tPLH tTHL tTLH 2.7V 1.3V 0.3V 1.3V 10% INVERTING OUTPUT INPUT GND 3V tr = 6ns tf = 6ns 90% CD74HC4067, CD74HCT4067 |
Ähnliche Teilenummer - CD74HCT4067ME4 |
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Ähnliche Beschreibung - CD74HCT4067ME4 |
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