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LC7581E Datenblatt(PDF) 4 Page - ON Semiconductor

Teilenummer LC7581E
Bauteilbeschribung  1/8 to 1/10 Duty Dot Matrix LCD Display Controllers/Drivers
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Hersteller  ONSEMI [ON Semiconductor]
Direct Link  http://www.onsemi.com
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LC75810E/T
No.7141-4/54
Specifications
Absolute Maximum Ratings at Ta
= 25°C, V
SS
= 0V
Parameter
Symbol
Conditions
Ratings
Unit
VDD max
VDD
−0.3 to +7.0
Maximum supply voltage
VLCD max
VLCD
−0.3 to +11.0
V
VIN1
CE, CL, DI, RES
−0.3 to +7.0
VIN2
OSC
−0.3 to VDD + 0.3
Input voltage
VIN3
VLCD1, VLCD2, VLCD3
−0.3 to VLCD + 0.3
V
VOUT1
OSC
−0.3 to VDD+ 0.3
Output voltage
VOUT2
VLCD0, S1 to S80, COM1 to COM10
−0.3 to VLCD + 0.3
V
IOUT1
S1 to S80
300
μA
Output current
IOUT2
COM1 to COM10
3mA
Allowable power dissipation
Pd max
Ta
= 85°C
200
mW
Operating temperature
Topr
−40 to +85
°C
Storage temperature
Tstg
−55 to +125
°C
Allowable Operating Ranges at Ta
= −40°C to + 85°C, V
SS
= 0V
Ratings
Parameter
Symbol
Conditions
min.
typ.
max.
Unit
VDD
VDD
2.7
6.0
When the display contrast adjustment circuit is used.
7.0
10.0
Supply voltage
VLCD
When the display contrast adjustment circuit is not used.
4.5
10.0
V
Output voltage
VLCD0
VLCD0
4.5
VLCD
V
VLCD1
VLCD1
3/4 VLCD0
VLCD0
VLCD2
VLCD2
2/4 VLCD0
VLCD0
Input voltage
VLCD3
VLCD3
1/4 VLCD0
VLCD0
V
Input high level voltage
VIH
CE, CL, DI, RES
0.8 VDD
6.0
V
Input low level voltage
VIL
CE, CL, DI, RES
0
0.2 VDD
V
Recommended external
resistance
Rosc
OSC
10
k
Ω
Recommended external
capacitance
Cosc
OSC
470
pF
Guaranteed oscillation range
fosc
OSC
150
300
600
kHz
Data setup time
tds
CL, DI
(Figure 2)
160
ns
Data hold time
tdh
CL, DI
(Figure 2)
160
ns
CE wait time
tcp
CE, CL
(Figure 2)
160
ns
CE setup time
tcs
CE, CL
(Figure 2)
160
ns
CE hold time
tch
CE, CL
(Figure 2)
160
ns
High level clock pulse width
t
φH
CL
(Figure 2)
160
ns
Low level clock pulse width
t
φL
CL
(Figure 2)
160
ns
Minimum reset pulse width
tWRES
RES
(Figure 3)
1
μs
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating
Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability.


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