Datenblatt-Suchmaschine für elektronische Bauteile |
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NE23383B Datenblatt(PDF) 1 Page - California Eastern Labs |
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NE23383B Datenblatt(HTML) 1 Page - California Eastern Labs |
1 / 3 page FEATURES • SUPER LOW NOISE FIGURE: NF = 0.35 dB TYP at f = 4 GHz • HIGH ASSOCIATED GAIN: GA = 15.0 dB TYP at f = 4 GHz • GATE LENGTH = LG = 0.3 µm • GATE WIDTH = WG = 280 µm • HERMETIC SEALED CERAMIC PACKAGE • HIGH RELIABILITY NE23383B SUPER LOW NOISE AMPLIFIER N-CHANNEL HJ FET (SPACE QUALIFIED) California Eastern Laboratories OUTLINE DIMENSIONS (Units in mm) PACKAGE OUTLINE 83B DESCRIPTION The NE23383B is a heterojunction FET that utilizes the heterojunction to create high mobility electrons. The device features mushroom shaped gate for decreased gate resis- tance and improved power handling capabilities. The mush- room gate structure also results in low noise figure and high associated gain. The device is housed in a rugged hermeti- cally sealed metal ceramic stripline package selected for industrial and space applications. NEC's stringent quality assurance and test procedures assure the highest reliability and performance. PART NUMBER NE23383B PACKAGE OUTLINE SYMBOLS PARAMETERS AND CONDITIONS UNITS MIN TYP MAX NF Noise Figure at VDS = 2 V, ID = 10 mA, f = 4 GHz dB 0.35 0.45 GA Associated Gain at VDS = 2 V, ID = 10 mA, f = 4 GHz dB 13.0 15.0 IDSS Saturated Drain Current at VDS = 2 V, VGS = 0 V mA 15 40 80 VGS(off) Gate to Source Cut off Voltage at VDS = 2 V, ID = 100 µA V -0.2 -0.8 -2.0 gM Transconductance at VDS = 2 V, ID = 10 mA ms 45 70 IGDO Gate to Drain Leakage Current at VGD = -3 V µA 0.5 10 IGSO Gate to Source Leakage Current at VGS = -3 V µA 0.5 10 ELECTRICAL CHARACTERISTICS (TA = 25°C) APPLICATION • BEST SUITED FOR LOW NOISE AMPS STAGE AT C AND X BAND 1.45 MAX 0.1 +0.07 -0.03 4.0 MIN (ALL LEADS) 0.5 ± 0.1 1.88 ± 0.3 1.88 ± 0.3 1.0 ± 0.1 1 2 4 3 |
Ähnliche Teilenummer - NE23383B |
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Ähnliche Beschreibung - NE23383B |
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