Datenblatt-Suchmaschine für elektronische Bauteile |
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TPD4E001-Q1 Datenblatt(PDF) 1 Page - Texas Instruments |
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TPD4E001-Q1 Datenblatt(HTML) 1 Page - Texas Instruments |
1 / 14 page GND V CC 1 2 6 3 5 4 DBV PACKAGE (TOP VIEW) IO1 IO4 IO3 IO2 TPD4E001-Q1 www.ti.com SLLSEG0C – MARCH 2013 – REVISED JUNE 2013 4-CHANNEL ESD PROTECTION ARRAY WITH 1.5-pF IO CAPACITANCE Check for Samples: TPD4E001-Q1 1 FEATURES • Qualified for Automotive Applications APPLICATIONS • AEC-Q100 Qualified With the Following • Automotive Infotainment Results: • USB 2.0 – Device Temperature Grade 1: –40°C to • Ethernet 125°C Ambient Operating Temperature • Precision Analog Interface Range • SVGA Connections – Device HBM ESD Classification Level H3B – HBM Level 15 kV – Device CDM ESD Classification Level C4B • 4-Channel ESD Clamp Array to Enhance System-Level ESD Protection • Exceeds IEC61000-4-2 (Level 4) ESD Protection Requirements – ±8-kV IEC 61000-4-2 Contact Discharge – ±15-kV IEC 61000-4-2 Air-Gap Discharge • 5.5-A Peak Pulse Current (8/20-µs Pulse) • Low 1.5-pF Input Capacitance • Low 10-nA (Max) Leakage Current • 0.9-V to 5.5-V Supply-Voltage Range DESCRIPTION The TPD4E001-Q1 is a low-capacitance ESD-protection diode array designed to protect sensitive electronics connected to communication lines. Each channel consists of a pair of diodes that steer ESD pulses to VCC or GND. The TPD4E001-Q1 protects against ESD pulses up to ±8-kV contact discharge and ±15-kV air-gap discharge, as specified in IEC 61000-4-2. This device has a 1.5-pF IO capacitance per channel, making it ideal for use in high-speed data IO interfaces. The low leakage current (10 nA maximum) ensures minimum power consumption for the system. ORDERING INFORMATION TA PACKAGE(1) ORDERABLE PART NUMBER TOP-SIDE MARKING –40°C to 125°C DBV (SOT-23) Reel of 3000 TPD4E001QDBVRQ1 AAXQ (1) For the most-current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI Web site at www.ti.com. 1 Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. PRODUCTION DATA information is current as of publication date. Copyright © 2013, Texas Instruments Incorporated Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. |
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