Datenblatt-Suchmaschine für elektronische Bauteile |
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AD5165 Datenblatt(PDF) 11 Page - Analog Devices |
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AD5165 Datenblatt(HTML) 11 Page - Analog Devices |
11 / 16 page AD5165 Rev. 0 | Page 11 of 16 TEST CIRCUITS Figure 27 to Figure 33 illustrate the test circuits that define the test conditions used in the product specification tables. VMS A W B DUT V+ V+ = VDD 1LSB = V+/2N Figure 27. Test Circuit for Potentiometer Divider Nonlinearity Error (INL, DNL) NO CONNECT IW VMS A W B DUT Figure 28. Test Circuit for Resistor Position Nonlinearity Error (Rheostat Operation; R-INL, R-DNL) VMS2 VMS1 VW A W B DUT IW = VDD/RNOMINAL RW = [VMS1 – VMS2]/IW Figure 29. Test Circuit for Wiper Resistance ∆V MS% DD% PSS (%/%) = V+ = VDD 10% PSRR (dB) = 20 LOG MS DD ( ) VDD VA VMS A W B V+ ∆V ∆V ∆V Figure 30. Test Circuit for Power Supply Sensitivity (PSS, PSSR) +15V –15V W A 2.5V B VOUT OFFSET GND DUT AD8610 VIN Figure 31. Test Circuit for Gain vs. Frequency W B GND TO VDD DUT ISW CODE = 0x00 RSW = 0.1V ISW 0.1V Figure 32. Test Circuit for Incremental ON Resistance W B VCM ICM A NC GND NC VDD DUT NC = NO CONNECT Figure 33. Test Circuit for Common-Mode Leakage Current |
Ähnliche Teilenummer - AD5165_15 |
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Ähnliche Beschreibung - AD5165_15 |
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