DAC161P997-DIE

www.ti.com

SLAS940 – MARCH 2013

Single-Wire 16-Bit DAC

Check for Samples: DAC161P997-DIE

1

FEATURES

2

•

16-Bit Linearity

APPLICATIONS

•

Single-Wire Interface (SWIF) With Handshake

•

Current Loop Transmitter

•

Digital Data Transmission (No Loss of Fidelity)

•

Industrial Process Control

•

Pin Programmable Power-Up Condition

•

Actuator Control

•

Self Adjusting to Input Data Rate

•

Factory Automation

•

Loop Error Detection and Reporting

•

Building Automation

•

Programmable Output Current Error Level

•

Precision Instruments

•

No External Precision Components

•

Data Acquisition Systems

•

Simple Interface to HART Modulator

•

Test Systems

DESCRIPTION

The DAC161P997-DIE is a 16- bit

∑Δ digital-to-analog converter (DAC) for transmitting an analog output current.

The data link to the DAC161P997-DIE is a single wire interface (SWIF) which allows sensor data to be

transferred

in

digital

format

over

an

isolation

boundary

using

a

single

isolation

component.

The

DAC161P997-DIE’s digital input is compatible with standard isolation transformers and optocouplers. Error

detection and handshaking features within the SWIF protocol ensure error free communication across the

isolation boundary. For applications where isolation is not required, the DAC161P997-DIE interfaces directly to a

microcontroller.

The loop drive of the DAC161P997-DIE interfaces to a highway addressable remote transducer (HART)

modulator, allowing injection of FSK modulated digital data into the current loop. This combination of

specifications and features makes the DAC161P997-DIE ideal for 2- and 4-wire industrial transmitters.

PACKAGE

PRODUCT

PACKAGE

ORDERABLE PART NUMBER

PACKAGE QUANTITY

DESIGNATOR

DAC161P997TDA1

324

DAC161P997

TD

DAC161P997TDA2

10

(1)

For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI

web site at www.ti.com.

(2)

Processing is per the Texas Instruments commercial production baseline and is in compliance with the Texas Instruments Quality

Control System in effect at the time of manufacture. Electrical screening consists of DC parametric and functional testing at room

temperature only. Unless otherwise specified by Texas Instruments AC performance and performance over temperature is not

warranted. Visual Inspection is performed in accordance with MIL-STD-883 Test Method 2010 Condition B at 75X minimum.

1

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of

Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

2

All trademarks are the property of their respective owners.

PRODUCTION DATA information is current as of publication date.

Copyright © 2013, Texas Instruments Incorporated

Products conform to specifications per the terms of the Texas

Instruments standard warranty. Production processing does not

necessarily include testing of all parameters.