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LM26001-Q1 Datenblatt(PDF) 4 Page - Texas Instruments |
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LM26001-Q1 Datenblatt(HTML) 4 Page - Texas Instruments |
4 / 31 page LM26001, LM26001-Q1 SNVS430I – MAY 2006 – REVISED MARCH 2015 www.ti.com 6 Specifications 6.1 Absolute Maximum Ratings (1) (2) MIN MAX UNIT VIN –0.3 40 V SW(3) –0.5 40 V VDD –0.3 7 V VBIAS –0.3 10 V FB –0.3 6 V Voltages BOOT SW-0.3 SW+7 V from the indicated PGOOD –0.3 7 V pins to FREQ –0.3 7 V GND SYNC –0.3 7 V EN –0.3 40 V FPWM –0.3 y7 V SS –0.3 7 V Power Dissipation(4)(5) 2.6 W Recomme Vapor Phase (70s) 215 °C nded Lead Infrared (15s) 220 °C Temperatu re Storage Tstg –65 150 °C temperatur e (1) Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Recommended Operating Conditions indicate conditions for which the device is intended to be functional, but do not ensure specific performance limits. For ensured specifications and test conditions, see the Electrical Characteristics. (2) If Military/Aerospace specified devices are required, please contact the Texas Instruments Sales Office/Distributors for availability and specifications. (3) The absolute maximum specification applies to DC voltage. An extended negative voltage limit of -2V applies for a pulse of up to 1 µs, and –1 V for a pulse of up to 20 µs. (4) The maximum allowable power dissipation is a function of the maximum junction temperature, TJ_MAX, the junction-to-ambient thermal resistance, θJA, and the ambient temperature, TA. The maximum allowable power dissipation at any ambient temperature is calculated using: PD_MAX = (TJ_MAX - TA) / θJA. The maximum power dissipation of 2.6W is determined using TA = 25°C, θJA = 38°C/W, and TJ_MAX = 125°C. The number stated here reflects the maximum power dissipation for the package and not the device. (5) For Device Power Dissipation, please refer to section 10.3. 6.2 ESD Ratings - LM26001 VALUE UNIT Human body model (HBM), per ANSI/ESDA/JEDEC JS-001, all pins(1) ± 2 kV Charged device model (CDM), per JEDEC specification JESD22-C101, ± 1 V(ESD) Electrostatic discharge all pins(2) Machine model ± 200 V (1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process. (2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process. 6.3 ESD Ratings - LM26001-Q1 VALUE UNIT Human body model (HBM), per AEC Q100-002(1) ± 2 Corner pins (1, 8, 9, and ± 1 kV Charged device model (CDM), per AEC 16) V(ESD) Electrostatic discharge Q100-011 Other pins ± 1 Machine model ± 200 V (1) AEC Q100-002 indicates HBM stressing is done in accordance with the ANSI/ESDA/JEDEC JS-001 specification. 4 Submit Documentation Feedback Copyright © 2006–2015, Texas Instruments Incorporated Product Folder Links: LM26001 LM26001-Q1 |
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