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UC1834VTD2 Datenblatt(PDF) 1 Page - Texas Instruments |
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UC1834VTD2 Datenblatt(HTML) 1 Page - Texas Instruments |
1 / 6 page Product Folder Sample & Buy Technical Documents Tools & Software Support & Community UC1834-DIE SLOS898 – NOVEMBER 2014 UC1834-DIE High Efficiency Linear Regulator 1 Features 3 Description The UC1834-DIE integrated circuit is optimized for 1 • Equally Usable for Either Positive or Negative the design of low input-output differential linear Regulator Design regulator. A high-gain amplifier and sink or source • Adjustable Low Threshold Current Sense drive outputs facilitate high-output current designs, Amplifier which use an external pass device. With both positive and negative precision references, either polarity of • Undervoltage and Overvoltage Fault Alert With regulator can be implemented. A current sense Programmable Delay amplifier with a low, adjustable threshold can be used to sense and limit currents in either the positive or 2 Applications negative supply lines. • Wireless LAN In addition, the UC1834-DIE has a fault monitoring • Programmable Logic Controller circuit which senses both undervoltage and • Motor Control and Drives overvoltage fault conditions. After a user defined delay for transient rejection, this circuitry provides a • Solar Energy Systems fault alert output for either fault condition. In the • Sonar, Ultrasound overvoltage case, a crowbar output is activated. An overvoltage latch maintains the crowbar output and can be used to shutdown the driver outputs. System control to the device can be accommodated at a single input, which will act as both a supply reset and remote shutdown terminal. These die are protected against excessive power dissipation by an internal thermal shutdown function. Ordering Information(1) PACKAGE PRODUCT PACKAGE ORDERABLE PART NUMBER PACKAGE QUANTITY DESIGNATOR UC1834VTD1 80 UC1834 TD Bare die in waffle pack(2) UC1834VTD2 10 (1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI website at www.ti.com. (2) Processing is per the Texas Instruments space production baseline and is in compliance with the Texas Instruments Quality Control System in effect at the time of manufacture. Electrical screening consists of DC parametric and functional testing at room temperature only. Unless otherwise specified by Texas Instruments AC performance and performance over temperature is not warranted. Visual Inspection is performed in accordance with MIL-STD-883 Test Method 2010 Condition B at 75X minimum. 1 An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications, intellectual property matters and other important disclaimers. PRODUCTION DATA. |
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