Datenblatt-Suchmaschine für elektronische Bauteile |
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DAC6571IDBVTG4 Datenblatt(PDF) 2 Page - Texas Instruments |
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DAC6571IDBVTG4 Datenblatt(HTML) 2 Page - Texas Instruments |
2 / 25 page www.ti.com PIN CONFIGURATIONS A0 SCL SDA 6 5 4 1 2 3 VOUT GND VDD 1 2 3 6 5 4 (TOP VIEW) (BOTTOM VIEW) Lot Trace Code ABSOLUTE MAXIMUM RATINGS (1) DAC6571 SLAS406B – DECEMBER 2003 – REVISED AUGUST 2005 This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. PACKAGE/ORDERING INFORMATION(1) SPECIFIED PACKAGE PACKAGE ORDERING PRODUCT PACKAGE TEMPERATURE TRANSPORT MEDIA DESIGNATOR MARKING NUMBER RANGE DAC6571IDBVT 250 Piece Small Tape and Reel DAC6571 SOT23-6 DBV – 40 °C to +105°C D671 DAC6571IDBVR 3000 Piece Tape and Reel (1) For the most current package and ordering information see the Package Option Addendum at the end of this datasheet, or see the TI web site at www.ti.com. PIN DESCRIPTION (SOT23-6) PIN NAME DESCRIPTION 1 VOUT Analog output voltage from DAC Ground reference point for all 2 GND circuitry on the part 3 VDD Analog Voltage Supply Input 4 SDA Serial Data Input 5 SCL Serial Clock Input 6 A0 Device Address Select LOT Year (3 = 2003); M onth (1–9 = JAN–SEP; A = TRACE OCT, B = NOV, C = DEC); LL — Random code CODE: generated when assembly is requested. UNITS VDD to GND –0.3 V to +6 V Digital input voltage to GND –0.3 V to +VDD + 0.3 V VOUT to GND –0.3 V to +VDD + 0.3 V Operating temperature range –40 °C to + 105°C Storage temperature range –65 °C to + 150°C Junction temperature range (TJ max) +150 °C Power dissipation (TJ max – TA)RθJA Thermal impedance, RθJA 240 °C/W Lead temperature, soldering Vapor phase (60s) 215 °C Infrared (15s) 220 °C (1) Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. Exposure to absolute maximum conditions for extended periods may affect device reliability. 2 |
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