Datenblatt-Suchmaschine für elektronische Bauteile |
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AD8284WCSVZ-RL Datenblatt(PDF) 4 Page - Analog Devices |
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AD8284WCSVZ-RL Datenblatt(HTML) 4 Page - Analog Devices |
4 / 28 page AD8284 Data Sheet Rev. D | Page 4 of 28 Parameter1 Test Conditions/Comments Min Typ Max Unit Power-Down Dissipation TA = −25°C to +105°C 2.5 4.0 mW TA = −40°C to +25°C 2.5 8.0 mW Power Supply Rejection Ratio (PSRR)2 Relative to input 1.6 mV/V ADC Resolution2 12 Bits Maximum Sample Rate 60 MSPS Signal-to-Noise Ratio (SNR) fIN = 1 MHz 67 dB Signal-to-Noise-and-Distortion Ratio (SINAD) 2 66 dB SNRFS2 68 dB Differential Nonlinearity (DNL) Guaranteed no missing codes 1 LSB Integral Nonlinearity (INL) fS = 60 MSPS 4 10 LSB Effective Number of Bits (ENOB)2 10.67 LSB ADC Output Characteristics2 Maximum Capacitor Load Per bit 20 pF IDVDD33 Peak Current with Capacitor Load2 Peak current per bit when driving a 20 pF load; can be programmed via the SPI port, if required 40 mA ADC REFERENCE Output Voltage Error VREF = 1.000 V ±20 mV Load Regulation At 1.0 mA, VREF = 1.000 V 2 mV Current Output −1 +1 mA Input Resistance 6 kΩ FULL CHANNEL CHARACTERISTICS LNA, PGA, AAF, and ADC SNRFS fIN = 1 MHz, −10 dBFS output Gain = 17 dB, fS = 60 MSPS 60 64 dBFS Gain = 23 dB, fS = 60 MSPS 60 64 dBFS Gain = 29 dB, fS = 60 MSPS 60 64 dBFS Gain = 35 dB, fS = 60 MSPS 60 64 dBFS SINAD2 fIN = 1 MHz Gain = 17 dB 62 dB Gain = 23 dB 63 dB Gain = 29 dB 64 dB Gain = 35 dB 63 dB Spurious-Free Dynamic Range (SFDR) fIN = 1 MHz, −10 dBFS output Gain = 17 dB, fS = 60 MSPS 62 68 dBc Gain = 23 dB, fS = 60 MSPS 62 68 dBc Gain = 29 dB, fS = 60 MSPS 62 68 dBc Gain = 35 dB, fS = 60 MSPS 62 71 dBc Harmonic Distortion2 fIN = 1 MHz at −10 dBFS output Second Harmonic Gain = 17 dB −70 dBc Gain = 35 dB −70 dBc Third Harmonic Gain = 17 dB −66 dBc Gain = 35 dB −75 dBc IM3 Distortion fIN1 = 1 MHz, fIN2 = 1.1 MHz, −1 dBFS, gain = 35 dB −69 dBc Gain Response Time 600 ns Overdrive Recovery Time 200 ns 1 See the AN-835 Application Note, Understanding High Speed ADC Testing and Evaluation, for a complete set of definitions and testing methodology. 2 Guaranteed by design only. |
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