Datenblatt-Suchmaschine für elektronische Bauteile |
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DAC7551TDRNRQ1 Datenblatt(PDF) 4 Page - Texas Instruments |
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DAC7551TDRNRQ1 Datenblatt(HTML) 4 Page - Texas Instruments |
4 / 27 page DAC7551-Q1 SLAS767B – JUNE 2011 – REVISED MARCH 2015 www.ti.com 6.2 ESD Ratings VALUE UNIT Human-body model (HBM), per AEC Q100-002(1) ±2000 All pins ±500 V(ESD) Electrostatic discharge V Charged-device model (CDM), per AEC Corner pins (1, 6, 7, and Q100-011 ±750 12) (1) AEC Q100-002 indicates that HBM stressing shall be in accordance with the ANSI/ESDA/JEDEC JS-001 specification. 6.3 Recommended Operating Conditions over operating free-air temperature range (unless otherwise noted) MIN NOM MAX UNIT VDD 2.7 5.5 VREFH 0.25 VDD VREFL 0 GND VDD VFB 0 VDD VI Input voltage IOVDD 1.8 VDD V CLR 0 IOVDD SYNC 0 IOVDD SCLK 0 IOVDD SDIN 0 IOVDD SDO 0 IOVDD VO Output voltage V VOUT 0 VDD TJ Operating junction temperature 150 °C 6.4 Thermal Information DRN (USON) THERMAL METRIC(1) UNIT 12 PINS RθJA Junction-to-ambient thermal resistance 49.8 RθJC(top) Junction-to-case (top) thermal resistance 45.8 RθJB Junction-to-board thermal resistance 18.2 °C/W ψJT Junction-to-top characterization parameter 0.8 ψJB Junction-to-board characterization parameter 18.3 RθJC(bot) Junction-to-case (bottom) thermal resistance 2.9 (1) For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953. 6.5 Electrical Characteristics all specifications at –40°C to +105°C, VDD = 2.7 to 5.5 V, VREFH = VDD, VREFL = GND, RL = 2 kΩ to GND, and CL = 200 pF to GND (unless otherwise noted). PARAMETER TEST CONDITIONS MIN TYP MAX UNIT STATIC PERFORMANCE(1) Resolution 12 Bits Relative accuracy ±0.35 ±1 LSB Differential nonlinearity Specified monotonic by design ±0.08 ±0.5 LSB Offset error ±12 mV Zero-scale error All zeroes loaded to DAC register ±12 mV Gain error ±0.15 %FSR Full-scale error ±0.5 %FSR Zero-scale error drift 7 μV/°C ppm of Gain temperature coefficient 3 FSR/°C (1) Linearity tested using a reduced code range of 30 to 4065; output unloaded. 4 Submit Documentation Feedback Copyright © 2011–2015, Texas Instruments Incorporated Product Folder Links: DAC7551-Q1 |
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