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ADS8471IRGZTG4 Datenblatt(PDF) 7 Page - Texas Instruments

Teilenummer ADS8471IRGZTG4
Bauteilbeschribung  16-BIT, 1-MSPS, PSEUDO-BIPOLAR, UNIPOLAR INPUT, MICROPOWER SAMPLING ANALOG-TO-DIGITAL CONVERTER WITH PARALLEL INTERFACE AND REFERENCE
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Hersteller  TI1 [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI1 - Texas Instruments

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TIMING CHARACTERISTICS
ADS8471
SLAS517 – DECEMBER 2007
All specifications typical at –40
°C to 85°C, +VA = 5 V +VBD = 3 V (1) (2) (3)
PARAMETER
MIN
TYP
MAX
UNIT
t(CONV)
Conversion time
67
700
ns
t(ACQ)
Acquisition time
270
300
ns
t(HOLD)
Sample capacitor hold time
25
ns
tpd1
CONVST low to BUSY high
40
ns
tpd2
Propagation delay time, end of conversion to BUSY low
25
ns
tpd3
Propagation delay time, start of convert state to rising edge of BUSY
25
ns
tw1
Pulse duration, CONVST low
40
ns
tsu1
Setup time, CS low to CONVST low
20
ns
tw2
Pulse duration, CONVST high
20
ns
CONVST falling edge jitter
10
ps
tw3
Pulse duration, BUSY signal low
t(ACQ)min
ns
tw4
Pulse duration, BUSY signal high
700
ns
th1
Hold time, first data bus transition (RD low, or CS low for read cycle, or BYTE input
40
ns
changes) after CONVST low
td1
Delay time, CS low to RD low
0
ns
tsu2
Setup time, RD high to CS high
0
ns
tw5
Pulse duration, RD low
50
ns
ten
Enable time, RD low (or CS low for read cycle) to data valid
30
ns
td2
Delay time, data hold from RD high
5
ns
td3
Delay time, BYTE rising edge or falling edge to data valid
10
30
ns
tw6
Pulse duration, RD high
20
ns
tw7
Pulse duration, CS high
20
ns
th2
Hold time, last RD (or CS for read cycle ) rising edge to CONVST falling edge
50
ns
tpd4
Propagation delay time, BUSY falling edge to next RD (or CS for read cycle) falling
0
ns
edge
td4
Delay time, BYTE edge to edge skew
0
ns
tsu3
Setup time, BYTE or transition to RD falling edge
10
ns
th3
Hold time, BYTE or transition to RD falling edge
10
ns
tdis
Disable time, RD high (CS high for read cycle) to 3-stated data bus
30
ns
td5
Delay time, BUSY low to MSB data valid delay
0
ns
td6
Delay time, CS rising edge to BUSY falling edge
50
ns
td7
Delay time, BUSY falling edge to CS rising edge
50
ns
tsu5
BYTE transition setup time, from BYTE transition to next BYTE transition
50
ns
tsu(ABORT) Setup time from the falling edge of CONVST (used to start the valid conversion) to the
next falling edge of CONVST (when CS = 0 and CONVST are used to abort) or to the
60
600
ns
next falling edge of CS (when CS is used to abort).
(1)
All input signals are specified with tr = tf = 5 ns (10% to 90% of +VBD) and timed from a voltage level of (VIL + VIH)/2.
(2)
See timing diagrams.
(3)
All timing are measured with 20-pF equivalent loads on all data bits and BUSY pins.
Copyright © 2007, Texas Instruments Incorporated
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