Datenblatt-Suchmaschine für elektronische Bauteile |
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CD74FCT543EN Datenblatt(PDF) 4 Page - Texas Instruments |
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CD74FCT543EN Datenblatt(HTML) 4 Page - Texas Instruments |
4 / 11 page CD74FCT543 BiCMOS OCTAL REGISTERED TRANSCEIVER WITH 3-STATE OUTPUTS SCBS742 – JULY 2000 4 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 recommended operating conditions (see Note 2) MIN MAX UNIT VCC Supply voltage 4.75 5.25 V VIH High-level input voltage 2 V VIL Low-level input voltage 0.8 V VI Input voltage 0 VCC V VO Output voltage 0 VCC V IOH High-level output current –15 mA IOL Low-level output current 64 mA ∆t/∆v Input transition rise or fall rate 0 10 ns/V TA Operating free-air temperature 0 70 °C NOTE 2: All unused inputs of the device must be held at VCC or GND to ensure proper device operation. Refer to the TI application report, Implications of Slow or Floating CMOS Inputs, literature number SCBA004. electrical characteristics over recommended operating free-air temperature range (unless otherwise noted) PARAMETER TEST CONDITIONS VCC TA = 25°C MIN MAX UNIT PARAMETER TEST CONDITIONS VCC MIN MAX MIN MAX UNIT VIK II = –18 mA 4.75 V –1.2 –1.2 V VOH IOH = –15 mA 4.75 V 2.4 2.4 V VOL IOL = 64 mA 4.75 V 0.55 0.55 V II VI = VCC or GND 5.25 V ±0.1 ±1 mA IOZ VO = VCC or GND 5.25 V ±0.5 ±10 mA IOS† VI = VCC or GND, VO = 0 5.25 V –60 –60 mA ICC VI = VCC or GND, IO = 0 5.25 V 8 80 mA ∆ICC‡ One input at 3.4 V, Other inputs at VCC or GND 5.25 V 1.6 1.6 mA Ci VI = VCC or GND 10 10 pF Co VO = VCC or GND 15 15 pF † Not more than one output should be tested at a time, and the duration of the test should not exceed 100 ms. ‡ This is the increase in supply current for each input at one of the specified TTL voltage levels rather than 0 V or VCC. timing requirements over recommended operating free-air temperature range (unless otherwise noted) (see Figure 1) MIN MAX UNIT tw Pulse duration LEAB or LEBA low 9 ns A or B before LEAB or LEBA ↑ Data high 3 t Setup time A or B before LEAB or LEBA ↑ Data low 3 ns tsu Setup time A or B before CEAB or CEBA ↑ Data high 3 ns A or B before CEAB or CEBA ↑ Data low 3 th Hold time A or B after LEAB or LEBA ↑ 2 ns th Hold time A or B after CEAB or CEBA ↑ 2 ns |
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