Datenblatt-Suchmaschine für elektronische Bauteile |
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CDCR61APWRG4 Datenblatt(PDF) 6 Page - Texas Instruments |
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CDCR61APWRG4 Datenblatt(HTML) 6 Page - Texas Instruments |
6 / 15 page CDCR61A DIRECT RAMBUS ™ CLOCK GENERATOR – LITE SCAS626 – FEBRUARY 2000 6 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 PARAMETER MEASUREMENT INFORMATION 39 Ω, ±5% 68 Ω, ±5% 68 Ω, ±5% 3 pF See Note A 100 pF 39 Ω, ±5% 3 pF See Note A RT = 28 Ω RT = 28 Ω (CLK) Measurement Node (CLKB) NOTE A: These capacitors represent parasitic capacitance. No discrete capacitors are used on the test board during device characterization. Figure 1. Test Load and Voltage Definitions (VO(STOP), VO(X), VO, VOH, VOL) CLK CLKB tc1 tc2 Cycle-to-cycle jitter = | tc1 – tc2| over 10000 consecutive cycles Figure 2. Cycle-to-Cycle Jitter CLK CLKB tc(i) tc(i) = nominal expected time Cycle-to-cycle jitter = | tc(i) – tc(i+1)| over 10000 consecutive cycles tc(i+1) Figure 3. Short-Term Cycle-to-Cycle Jitter over 2, 3, 4, or 6 Cycles CLK CLKB t(cycle) tjL = | t(cycle), max– t(cycle), min| over 10000 consecutive cycles Figure 4. Long-Term Jitter |
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