Datenblatt-Suchmaschine für elektronische Bauteile |
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FDC1004DSCR Datenblatt(PDF) 6 Page - Texas Instruments |
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FDC1004DSCR Datenblatt(HTML) 6 Page - Texas Instruments |
6 / 33 page FDC1004 SNOSCY5B – AUGUST 2014 – REVISED APRIL 2015 www.ti.com 7.5 Electrical Characteristics (1) Over recommended operating temperature range, VDD = 3.3 V, for TA = 25°C (unless otherwise noted). PARAMETER TEST CONDITION MIN(2) TYP(3) MAX(2) UNIT POWER SUPPLY IDD Supply current Conversion mode; Digital input to 750 950 µA VDD or GND Standby; Digital input to VDD or 29 70 µA GND CAPACITIVE INPUT ICR Input conversion range ±15 pF COMAX Max input offset capacitance per channel, Series resistance at 100 pF CINn n=1.4 = 0 Ω RES Effective resolution (4) Sample rate = 100S/s (5) 16 bit EON Output noise Sample rate = 100S/s (5) 33.2 aF/ √Hz ERR Absolute error after offset calibration ±6 fF TcCOFF Offset deviation over temperature -40°C < T < 125°C 46 fF GERR Gain error 0.2 % tcG Gain drift vs. temperature -40°C < T < 125°C -37.5 ppm/°C PSRR DC power supply rejection 3 V < VDD < 3.6 V, single-ended 13.6 fF/V mode (channel vs GND) CAPDAC FRCAPDAC Full-scale range 96.9 pF TcCOFFCAP Offset drift vs. temperature -40°C < T < 125°C 30 fF DAC EXCITATION ƒ Frequency 25 kHz VAC AC voltage across capacitance 2.4 Vpp VDC Average DC voltage across 1.2 V capacitance SHIELD DRV Driver capability ƒ = 25 kHz, SHLDn to GND, n = 1,2 400 pF (1) Electrical Characteristics Table values apply only for factory testing conditions at the temperature indicated. Factor testing conditions result in very limited self-heating of the device such that TJ=TA. No guarantee of parametric performance is indicated in the electrical tables under conditions of internal self-heating where TJ>TA. Absolute Maximum Ratings indicate junction temperature limits beyond which the device may be permanently degraded, either mechanically or electrically. (2) Limits are ensured by testing, design, or statistical analysis at 25Degree C. Limits over the operating temperature range are ensured through correlations using statistical quality control (SQC) method. (3) Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary over time and will also depend on the application and configuration. The typical values are not tested and are not guaranteed on shipped production material. (4) Effective resolution is the ratio of converter full scale range to RMS measurement noise. (5) No external capacitance connected. 7.6 I 2C Interface Voltage Level Over recommended operating free-air temperature range, VDD = 3.3 V, for TA = TJ = 25°C (unless otherwise noted). PARAMETER TEST CONDITIONS MIN TYP MAX UNIT VIH Input high voltage 0.7*VDD V VIL Input low voltage 0.3*VDD V VOL Output low voltage Sink current 3 mA 0.4 V HYS Hysteresis (1) 0.1*VDD V (1) This parameter is specified by design and/or characterization and is not tested in production. 6 Submit Documentation Feedback Copyright © 2014–2015, Texas Instruments Incorporated Product Folder Links: FDC1004 |
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