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FDC2114QRGHRQ1 Datenblatt(PDF) 7 Page - Texas Instruments |
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FDC2114QRGHRQ1 Datenblatt(HTML) 7 Page - Texas Instruments |
7 / 61 page SCL SDA tHD;STA tLOW tr tHD;DAT tHIGH tf tSU;DAT tSU;STA tSU;STO tf START REPEATED START STOP tHD;STA START tSP tr tBUF FDC2212, FDC2214, FDC2112, FDC2114 www.ti.com SNOSCZ5A – JUNE 2015 – REVISED JUNE 2015 Electrical Characteristics (continued) Unless otherwise specified, all limits ensured for TA = 25°C, VDD = 3.3 V (1) PARAMETER TEST CONDITIONS(2) MIN(3) TYP(4) MAX(3) UNIT VCLKIN_HI CLKIN high voltage threshold 0.7*VDD V fINTCLK Internal master clock frequency 35 43.4 55 MHz range TCf_int_μ Internal master clock temperature –13 ppm/°C coefficient mean 8.6 Timing Requirements MIN NOM MAX UNIT tSDWAKEUP Wake-up time from SD high-low transition to I2C readback 2 ms tSLEEPWAKEUP Wake-up time from sleep mode 0.05 ms tWD-TIMEOUT Sensor recovery time (after watchdog timeout) 5.2 ms I2C TIMING CHARACTERISTICS fSCL Clock frequency 10 400 kHz tLOW Clock low time 1.3 μs tHIGH Clock high time 0.6 μs Hold time (repeated) START condition: after this period, the first clock tHD;STA 0.6 μs pulse is generated tSU;STA Setup time for a repeated START condition 0.6 μs tHD;DAT Data hold time 0 μs tSU;DAT Data setup time 100 ns tSU;STO Setup time for STOP condition 0.6 μs tBUF Bus free time between a STOP and START condition 1.3 μs tVD;DAT Data valid time 0.9 μs tVD;ACK Data valid acknowledge time 0.9 μs tSP Pulse width of spikes that must be suppressed by the input filter(1) 50 ns (1) This parameter is specified by design and/or characterization and is not tested in production. Figure 1. I2C Timing Copyright © 2015, Texas Instruments Incorporated Submit Documentation Feedback 7 Product Folder Links: FDC2212 FDC2214 FDC2112 FDC2114 |
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